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公开(公告)号:US20200064206A1
公开(公告)日:2020-02-27
申请号:US16674928
申请日:2019-11-05
Applicant: Socionext Inc.
Inventor: Hiroyuki HAMANO , Takashi MIYAZAKI
Abstract: A temperature measuring device includes first and second semiconductor elements each of which has a p-n junction, a transistor group including a plurality of transistors of which respective sources are connected to a power source and of which respective gates are connected to each other, the plurality of transistors constituting a current source, the transistor group being configured to output a first current and a second current having a different magnitude from the first current to the first and second semiconductor elements, respectively, and a selector configured to select at least one first transistor and a plurality of second transistors different from the first transistor, from among the plurality of transistors.
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公开(公告)号:US20230163797A1
公开(公告)日:2023-05-25
申请号:US18057054
申请日:2022-11-18
Applicant: Socionext Inc.
Inventor: Kenta ARUGA , Takashi MIYAZAKI , Daisuke KIMURA , Yasuhiro MAJIMA , Shunichiro MASAKI , Shunsuke HIRANO
CPC classification number: H04B1/10 , H04L27/0008
Abstract: A processing circuit includes: a clock generating circuit configured to generate, based on a reference clock signal and a frequency division ratio, a first clock signal; a frequency dividing and delay circuit configured to generate a second clock signal to have a first phase difference with the reference clock signal by dividing the frequency of the first clock signal and delaying the first clock signal based on a phase shift set signal and the frequency division ratio; an analog-to-digital converter circuit configured to convert an analog signal into a digital signal based on the first clock signal and a conversion trigger signal indicating a sampling period and a conversion period; and a control circuit configured to generate the conversion trigger signal to have the same cycle as the second clock signal based on the frequency division ratio and the first clock signal.
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