Optical measurement system
    3.
    发明申请

    公开(公告)号:US20170350760A1

    公开(公告)日:2017-12-07

    申请号:US15524628

    申请日:2015-11-05

    CPC classification number: G01J3/26 G01J3/0202 G01J3/0256 G01J3/0286

    Abstract: The present invention concerns an optical measurement system comprising an electrically tunable Peltier element, a detector for detecting radiation from a radiation source in a measurement area, the detector being in thermal connection with the Peltier element, an electrically tunable Fabry-Perot interferometer placed in the path of the radiation prior to the detector, the Fabry-Perot interferometer being in thermal connection with the Peltier element, and control electronics circuitry configured to control the Peltier element, the interferometer, and the detector. The present invention further concerns a method for analyzing the spectrum of an object.

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