摘要:
Discovery of DDJ within measured Total Jitter (TJ) begins with a suitably long digital Test Pattern, from which an Acquisition Record is made. A Time Interval Error/Voltage Error Record is made of the Acquisition Record. A Template defines a collection of associated bit value or transitions that are nearby or otherwise related to a bit location of interest, and through the applied test pattern produces a sequence of Data Symbols. The TIE/VLE Record is examined, and a parameter is measured for each Data Symbol as it occurs in the Test Pattern. A regression technique may be use to find coefficients for a DDJ Calculator whose inputs are the Data Symbols and whose output is respective values of DDJ. Subsequent separation of DDJ from TJ is possible because DDJ is correlated with the Data Symbols, while Periodic Jitter (PJ) and Random Jitter (RJ) can be expected to average to near zero over a sufficient number of instances of a given Data Symbol.
摘要:
Discovery of RJ assumes an Adjusted TIE Record for TJ from which DDJ has been removed. What remains is PJ+RJ, from whose Fourier Transform PJ is ‘synthetically de-convolved’ to leave just RJ: Calculate the Power Density Spectrum of PJ+RJ, and determine a threshold that indicates a PJ component. Identify in the PDS the largest frequency component that exceeds the threshold, otherwise there is no significant PJ and PJ+RJ can be taken as RJ. If a frequency component exceeds the threshold, take the largest and calculate what the convolution of it with the FT of the Transition Pattern would be if this circumstance were to occur in isolation, and then remove it from PJ+RJ. Repeat with continued iterations, until there are no further PJ components.
摘要:
A probe apparatus for use with analyzing devices, primarily oscilloscopes and logic analyzers, which uses pole-zero cancellation to provide a probe with low capacitance and wide bandwidth. Pole-zero cancellation enables the probe to have constant gain at all frequencies. In one embodiment, the coaxial cable between the probe tip and the replication amplifier is terminated in its characteristic impedance to provide constant gain at all frequencies regardless of cable length. Use of pole-zero cancellation and thick film technology enables building a probe with a small, durable tip.
摘要:
An electronic probe has a termination portion, a filter, and an impedance device. The termination portion is connected between a transmission line end and a common node. The termination portion has a termination resistor and a termination capacitor connected in series between the transmission line end and the common node. The filter has a resistor connected in parallel with a capacitor and an inductor connected in series with the filter resistor and filter capacitor combination. The components are connected between the transmission line end and an output. An impedance device is connected between the output and the common node. A zero is associated with the termination portion and a pole is associated with the filter. The frequency of the zero is approximately equal to the frequency of the pole. The probe provides a device for measuring tri-state logic circuits without overloading the circuits.
摘要:
Equalized Acquisition Record are prepared from Original Acquisition Records reflecting Total Jitter and from an existing description of DDJ. Removal of timing DDJ alters the locations of edges associated with data events. Voltage DDJ adjusts the asserted voltage in the central portion of a Unit Interval. One technique for equalizing timing jitter variably interpolates along the existing Original Acquisition Record to discover plausible new voltage values to assign to existing sample locations along the time axis. Another technique construes the desired amount of correction for each data event as an impulse that is applied to a Finite Impulse Response Filter whose output is a Voltage Correction Waveform having a smoothed voltage excursion. Time variant voltage values output from the Finite Impulse Response Filter are collected into a Voltage Correction Waveform Record having entry times found in the Original Acquisition Record. An entry by entry addition of these two Records produces the Equalized Acquisition Record.
摘要:
Edge mounting flexible media to a rigid PC board construction can be achieved by various methods. In any method used, there is a desire to create solderable pads on the edge of the rigid PC board. In accordance with the invention, the solderable pads are created by edge plating the PC Board or by a sliced via method. Depending on the type of flexible transmission line used, the construction will differ accordingly. For terminating flexible circuit media, the flex pads are laid out in such a way that the pads are etched in a configuration that matches up with the edge pads on the rigid PC Board. Solder past is then applied to the pads on the flex. The rigid PC Board is fixtured at a right angle to the flex and run through the reflow oven.
摘要:
Trigger jitter in an internally triggered real time digital oscilloscope can be reduced through correcting the horizontal position value obtained from a conventional trigger interpolation mechanism by an error or substitute amount learned from an inspection of the acquisition record that notes where in the acquisition record the signal actually crossed the trigger threshold. The display (and measurement) sub-systems that utilize the selection by panning and zooming of a portion of the acquisition record for viewing (and measurement) are supplied with the acquisition record portion of interest, and with an associated horizontal position value that originates with trigger interpolation and that may be subsequently modified by panning. After the trigger circuit detects the trigger condition for a new acquisition record, the voltage threshold for the trigger level in use by the trigger circuit can be compared to the region proximate the trigger location in the acquisition record to determine by further local interpolation the precise location in the acquisition record where the triggering event should have occurred. This allows the determination of a correct and jitter free horizontal position value. Actual display of the desired portion of each new acquisition record then proceeds by supplying to the display rendering system a corrected associated horizontal position value. This reduction in visible trigger jitter is also beneficial to measurements made on the displayed trace.
摘要:
Disclosed is a system and method for probing target pads in a dense pad array while minimizing distortion of a signal on the pads probed due to the probe load on the target pads and minimizing an amount of cross-talk between aggressor conductors in the dense pad array and the probe tip. In one embodiment, a probe tip arrangement is provided comprising a pad located in a dense pad array and a first probe tip resistor having first and second ends, the first end being coupled to the pad. The first probe tip resistor is positioned directly adjacent to the pad as closely as manufacturing processes will allow. The probe tip arrangement further includes an access transmission line coupled to the second end of the first probe tip resistor and extending outside of the dense pad array to a second probe tip resistor The second probe tip resistor may, in turn, be coupled to an electrical connector which in turn is coupled to a logic analyzer or oscilloscope to test the signal on the respective pad of the pad array.
摘要:
Disclosed is a system and method for probing target pads in a dense pad array while minimizing distortion of a signal on the pads probed due to the probe load on the target pads and minimizing an amount of cross-talk between aggressor conductors in the dense pad array and the probe tip. In one embodiment, a probe tip arrangement is provided comprising a pad located in a dense pad array and a first probe tip resistor having first and second ends, the first end being coupled to the pad. The first probe tip resistor is positioned directly adjacent to the pad as closely as manufacturing processes will allow. The probe tip arrangement further includes an access transmission line coupled to the second end of the first probe tip resistor and extending outside of the dense pad array to a second probe tip resistor. The second probe tip resistor may, in turn, be coupled to an electrical connector which in turn is coupled to a logic analyzer or oscilloscope to test the signal on the respective pad of the pad array.