Apparatus and method for probing integrated circuits using laser illumination
    1.
    发明授权
    Apparatus and method for probing integrated circuits using laser illumination 有权
    使用激光照明探测集成电路的装置和方法

    公开(公告)号:US07616312B2

    公开(公告)日:2009-11-10

    申请号:US11169423

    申请日:2005-06-29

    IPC分类号: G01B11/00

    CPC分类号: G01R31/308 G01R31/311

    摘要: An apparatus and method for laser probing of a DUT at very high temporal resolution is disclosed. The system includes a CW laser source, a beam optics designed to point two orthogonally polarized beams at the same location on the DUT, optical detectors for detecting the reflected beams, collection electronics, and an oscilloscope. The beam optics defines a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the laser beam into two beams of orthogonal polarization. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.

    摘要翻译: 公开了一种以非常高的时间分辨率激光探测DUT的装置和方法。 该系统包括CW激光源,设计用于在DUT上的相同位置处指向两个正交偏振光束的光束光学元件,用于检测反射光束的光学检测器,收集电子器件和示波器。 光束光学器件定义了共路径偏振微分探测(PDP)光学器件。 公共路径PDP光学将激光束分成两束正交极化。 由于CMOS晶体管的固有不对称性,光束与DUT的相互作用在每个光束中产生不同的相位调制。 可以研究这种差异来研究DUT对刺激信号的响应。

    Laser probing system for integrated circuits
    2.
    发明申请
    Laser probing system for integrated circuits 有权
    集成电路激光探测系统

    公开(公告)号:US20070002329A1

    公开(公告)日:2007-01-04

    申请号:US11169423

    申请日:2005-06-29

    IPC分类号: G01B9/02

    CPC分类号: G01R31/308 G01R31/311

    摘要: An apparatus and method for laser probing of a DUT at very high temporal resolution is disclosed. The system includes a CW laser source, a beam optics designed to point two orthogonally polarized beams at the same location on the DUT, optical detectors for detecting the reflected beams, collection electronics, and an oscilloscope. The beam optics defines a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the laser beam into two beams of orthogonal polarization. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.

    摘要翻译: 公开了一种以非常高的时间分辨率激光探测DUT的装置和方法。 该系统包括CW激光源,设计用于在DUT上的相同位置处指向两个正交偏振光束的光束光学元件,用于检测反射光束的光学检测器,收集电子器件和示波器。 光束光学器件定义了共路径偏振微分探测(PDP)光学器件。 公共路径PDP光学将激光束分成两束正交极化。 由于CMOS晶体管的固有不对称性,光束与DUT的相互作用在每个光束中产生不同的相位调制。 可以研究这种差异来研究DUT对刺激信号的响应。

    Apparatus and method for probing integrated circuits using polarization difference probing
    3.
    发明授权
    Apparatus and method for probing integrated circuits using polarization difference probing 有权
    使用偏振差探测探测集成电路的装置和方法

    公开(公告)号:US07659981B2

    公开(公告)日:2010-02-09

    申请号:US11261996

    申请日:2005-10-27

    IPC分类号: G01B11/00

    CPC分类号: G01R31/307

    摘要: A system for probing a DUT is disclosed, the system having a pulsed laser source, a CW laser source, beam optics designed to point a reference beam and a probing beam at the same location on the DUT, optical detectors for detecting the reflected reference and probing beams, and a collection electronics. The beam optics is a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the incident laser beam into two beams of orthogonal polarization—one beam simulating a reference beam while the other simulating a probing beam. Both reference and probing beams are pointed to the same location on the DUT. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the reference and probing beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.

    摘要翻译: 公开了一种用于探测DUT的系统,该系统具有脉冲激光源,CW激光源,设计用于将DUT上的相同位置处的参考光束和探测光束指向的光束光学元件,用于检测反射参考的光学检测器和 探测梁和收集电子设备。 光束光学器件是公共路径偏振微分探测(PDP)光学器件。 共轨PDP光学器件将入射激光束分成模拟参考光束的两个正交偏振光束,另一个模拟探测光束。 参考和探测光束都指向DUT上相同的位置。 由于CMOS晶体管的固有不对称性,参考光束和探测光束与DUT的相互作用导致每个光束中的不同相位调制。 可以研究这种差异来研究DUT对刺激信号的响应。

    Laser probing system for integrated circuits
    4.
    发明申请
    Laser probing system for integrated circuits 有权
    集成电路激光探测系统

    公开(公告)号:US20070046947A1

    公开(公告)日:2007-03-01

    申请号:US11261996

    申请日:2005-10-27

    IPC分类号: G01B9/02

    CPC分类号: G01R31/307

    摘要: A system for probing a DUT is disclosed, the system having a pulsed laser source, a CW laser source, beam optics designed to point a reference beam and a probing beam at the same location on the DUT, optical detectors for detecting the reflected reference and probing beams, and a collection electronics. The beam optics is a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the incident laser beam into two beams of orthogonal polarization - one beam simulating a reference beam while the other simulating a probing beam. Both reference and probing beams are pointed to the same location on the DUT. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the reference and probing beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.

    摘要翻译: 公开了一种用于探测DUT的系统,该系统具有脉冲激光源,CW激光源,设计用于将DUT上的相同位置处的参考光束和探测光束指向的光束光学元件,用于检测反射参考的光学检测器和 探测梁和收集电子设备。 光束光学器件是公共路径偏振微分探测(PDP)光学器件。 公共路径PDP光学器件将入射激光束分成两束正交偏振光束 - 一个模拟参考光束的光束,另一个模拟探测光束。 参考和探测光束都指向DUT上相同的位置。 由于CMOS晶体管的固有不对称性,参考光束和探测光束与DUT的相互作用导致每个光束中的不同相位调制。 可以研究这种差异来研究DUT对刺激信号的响应。

    APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS
    6.
    发明申请
    APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS 有权
    用于检测晶体管光子发射的装置和方法

    公开(公告)号:US20060181268A1

    公开(公告)日:2006-08-17

    申请号:US11380044

    申请日:2006-04-25

    IPC分类号: G01R31/28

    CPC分类号: G01R31/2656 G01R31/311

    摘要: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

    摘要翻译: 用于分析光子发射数据以鉴别由晶体管发射的光子和由背景源发射的光子的系统,装置和方法。 该分析涉及光子发射的空间和/或时间相关性。 在相关之后,分析可进一步涉及获得相关光子由晶体管发射的可能性。 在相关之后,分析还可以进一步包括将权重分配给单个光子发射作为相关性的函数。 在一些情况下,重量反映了光子被晶体管发射的可能性。 该分析还可以包括自动识别光子发射图像中的晶体管。

    Single pair PHY with auto-negotiation
    8.
    发明授权
    Single pair PHY with auto-negotiation 有权
    单对PHY与自动协商

    公开(公告)号:US09130746B1

    公开(公告)日:2015-09-08

    申请号:US13350969

    申请日:2012-01-16

    申请人: William Lo

    发明人: William Lo

    IPC分类号: H04L5/16 H04L5/14

    摘要: Systems, methods, and other embodiments associated with auto-negotiating over a single pair PHY are described. According to one embodiment, an apparatus includes a physical layer (PHY) transceiver configured to communicate over a single twisted pair channel. The apparatus includes a setup logic configured to control the PHY transceiver to initiate an auto-negotiation sequence over the single twisted pair channel with a remote device upon detecting a transmission from the remote device on the single twisted pair channel. The auto-negotiation sequence includes an exchange of parameters with the remote device using a half-duplex mode to communicate on the single twisted pair channel.

    摘要翻译: 描述了通过单对PHY自动协商相关联的系统,方法和其他实施例。 根据一个实施例,一种装置包括被配置为通过单个双绞线信道进行通信的物理层(PHY)收发器。 该装置包括设置逻辑,其被配置为在检测到来自单个双绞线信道上的远程设备的传输时,通过远程设备来控制PHY收发器在单个双绞线信道上发起自动协商序列。 自动协商序列包括使用半双工模式与远程设备交换参数,以在单个双绞线信道上进行通信。

    Cable tester
    9.
    发明授权
    Cable tester 有权
    电缆测试仪

    公开(公告)号:US08179144B1

    公开(公告)日:2012-05-15

    申请号:US13023410

    申请日:2011-02-08

    IPC分类号: G01R31/11

    CPC分类号: H04L43/50 G01R31/11 H04L12/10

    摘要: A network device including a physical layer (PHY) device and an autonegotiation module. The PHY device is configured to interface with N cable pairs, where N is greater than 1. The PHY device includes a cable test module configured to diagnose a short circuit in one of the N cable pairs. The autonegotiation module is configured to i) selectively perform autonegotiation to establish a link with a link partner at one of a first link speed and a second link speed that is lower than the first link speed, and ii) select between the first link speed and the second link speed in response to the cable test module diagnosing the short circuit.

    摘要翻译: 一种包括物理层(PHY)设备和自动协商模块的网络设备。 PHY设备被配置为与N个大于1的N个电缆对接口。PHY设备包括被配置为诊断N个电缆对之一中的短路的电缆测试模块。 自动协商模块被配置为:i)选择性地执行自动协商以便以低于第一链路速度的第一链路速度和第二链路速度中的一个建立与链路伙伴的链路,以及ii)在第一链路速度和 响应于电缆测试模块诊断短路的第二链路速度。

    Chip-to-chip interface for 1000 BASE T gigabit physical layer device
    10.
    发明授权
    Chip-to-chip interface for 1000 BASE T gigabit physical layer device 有权
    千兆比特物理层设备的芯片到芯片接口

    公开(公告)号:US08018962B1

    公开(公告)日:2011-09-13

    申请号:US12723915

    申请日:2010-03-15

    IPC分类号: H04L12/56

    摘要: A physical layer interface for a switch. The physical layer interface includes an auto-negotiation circuit, a transceiver, and a serial interface. The auto-negotiation circuit is configured to negotiate a first data transmission rate with a network client. The transceiver is configured to communicate with the network client at the data transmission rate. The serializer interface is configured to communicate with a media access controller (MAC) at a second data transmission rate that is different than the first data transmission rate.

    摘要翻译: 交换机的物理层接口。 物理层接口包括自动协商电路,收发器和串行接口。 自动协商电路被配置为与网络客户端协商第一数据传输速率。 收发器被配置为以数据传输速率与网络客户端进行通信。 序列化器接口被配置为以与第一数据传输速率不同的第二数据传输速率与媒体接入控制器(MAC)进行通信。