Semiconductor memory device with stacked memory cell and method of manufacturing the stacked memory cell
    1.
    发明申请
    Semiconductor memory device with stacked memory cell and method of manufacturing the stacked memory cell 有权
    具有堆叠存储单元的半导体存储器件和制造堆叠存储单元的方法

    公开(公告)号:US20060120148A1

    公开(公告)日:2006-06-08

    申请号:US11238381

    申请日:2005-09-29

    IPC分类号: G11C11/00

    摘要: In a semiconductor memory device and method, phase-change memory cells are provided, each including a plurality of control transistors formed on different layers and variable resistance devices formed of a phase-change material. Each phase-change memory cell includes a plurality of control transistors formed on different layers, and a variable resistance device formed of a phase-change material. In one example, the number of the control transistors is two. The semiconductor memory device includes a global bit line; a plurality of local bit lines connected to or disconnected from the global bit line via local bit line selection circuits which correspond to the local bit lines, respectively; and a plurality of phase-change memory cell groups storing data while being connected to the local bit lines, respectively. Each of the phase-change memory cells of each of the phase-change memory cell groups comprises a plurality of control transistors formed on different layers, and a variable resistance device formed of a phase-change material. In addition, the semiconductor memory device has a hierarchical bit line structure that uses a global bit line and local bit lines. Accordingly, it is possible to increase both the integration density of the semiconductor memory device and the amount of current flowing through each of the phase-change memory cells.

    摘要翻译: 在半导体存储器件和方法中,提供了相变存储单元,每个都包括形成在不同层上的多个控制晶体管和由相变材料形成的可变电阻器件。 每个相变存储单元包括形成在不同层上的多个控制晶体管和由相变材料形成的可变电阻器件。 在一个示例中,控制晶体管的数量是两个。 半导体存储器件包括全局位线; 通过分别对应于本地位线的本地位线选择电路分别连接到全局位线或与全局位线断开的多个局部位线; 以及分别在连接到本地位线时存储数据的多个相变存储单元组。 每个相变存储单元组的每个相变存储单元包括形成在不同层上的多个控制晶体管和由相变材料形成的可变电阻器件。 此外,半导体存储器件具有使用全局位线和局部位线的分层位线结构。 因此,可以增加半导体存储器件的集成密度和流过每个相变存储单元的电流量。

    Apparatus and Systems Using Phase Change Memories
    2.
    发明申请
    Apparatus and Systems Using Phase Change Memories 有权
    使用相变记忆的装置和系统

    公开(公告)号:US20110242886A1

    公开(公告)日:2011-10-06

    申请号:US13091238

    申请日:2011-04-21

    IPC分类号: G11C11/21

    摘要: Apparatus and systems that use phase-change memory devices are provided. The phase-change memory devices may include multiple phase-change memory cells and a reset pulse generation circuit configured to output multiple sequential reset pulses. Each sequential reset pulse is output to a corresponding one of multiple reset lines. Multiple write driver circuits are coupled to corresponding phase change memory cells and to a corresponding one of the reset lines of the reset pulse generation circuit.

    摘要翻译: 提供了使用相变存储器件的装置和系统。 相变存储器件可以包括多个相变存储器单元和被配置为输出多个顺序复位脉冲的复位脉冲发生电路。 每个顺序复位脉冲被输出到多个复位线中相应的一个。 多个写入驱动器电路耦合到相应的相变存储器单元和复位脉冲发生电路的相应的一个复位线。

    Phase-changeable memory device and read method thereof
    3.
    发明授权
    Phase-changeable memory device and read method thereof 有权
    相变存储器件及其读取方法

    公开(公告)号:US07391644B2

    公开(公告)日:2008-06-24

    申请号:US11605212

    申请日:2006-11-29

    IPC分类号: G11C11/00

    摘要: Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.

    摘要翻译: 公开了一种可变相存储器件和读取数据的相关方法。 存储器件包括存储器单元,高压电路,预充电电路,偏置电路和读出放大器。 每个存储单元包括相位可变材料和连接到位线的二极管。 高压电路从电源提供高电压。 预充电电路将位线充电至电源电压后,将位线升高至高电压。 偏置电路通过高电压向位线提供读取电流。 读出放大器通过高电压将位线的电压与参考电压进行比较,并从存储单元读取数据。 存储器件能够减少在预充电操作期间对高压电路的负担,从而在感测操作期间确保足够的感测余量。

    APPARATUS AND SYSTEMS USING PHASE CHANGE MEMORIES
    4.
    发明申请
    APPARATUS AND SYSTEMS USING PHASE CHANGE MEMORIES 有权
    使用相变记忆的装置和系统

    公开(公告)号:US20080137402A1

    公开(公告)日:2008-06-12

    申请号:US11949342

    申请日:2007-12-03

    IPC分类号: G11C11/00

    摘要: Apparatus and systems that use phase-change memory devices are provided. The phase-change memory devices may include multiple phase-change memory cells and a reset pulse generation circuit configured to output multiple sequential reset pulses. Each sequential reset pulse is output to a corresponding one of multiple reset lines. Multiple write driver circuits are coupled to corresponding phase change memory cells and to a corresponding one of the reset lines of the reset pulse generation circuit.

    摘要翻译: 提供了使用相变存储器件的装置和系统。 相变存储器件可以包括多个相变存储器单元和被配置为输出多个顺序复位脉冲的复位脉冲发生电路。 每个顺序复位脉冲被输出到多个复位线中相应的一个。 多个写入驱动器电路耦合到相应的相变存储器单元和复位脉冲发生电路的相应的一个复位线。

    Phase change memory device and related programming method
    5.
    发明申请
    Phase change memory device and related programming method 有权
    相变存储器件及相关编程方法

    公开(公告)号:US20070230240A1

    公开(公告)日:2007-10-04

    申请号:US11724268

    申请日:2007-03-15

    IPC分类号: G11C11/00

    摘要: A phase change memory device comprises a memory cell array and a write driver circuit. The memory cell array comprises a plurality of memory cells, and the write driver circuit comprises a set current driver and a reset current driver. The set current driver is adapted to provide a set current to a selected memory cell among the plurality of memory cells and the reset current driver is adapted to provide a reset current to a selected memory cell among the plurality of memory cells.

    摘要翻译: 相变存储器件包括存储单元阵列和写入驱动器电路。 存储单元阵列包括多个存储单元,并且写驱动器电路包括设定电流驱动器和复位电流驱动器。 所设置的电流驱动器适于向所述多个存储器单元中的所选择的存储单元提供设定电流,并且所述复位电流驱动器适于向所述多个存储器单元中的所选存储单元提供复位电流。

    Flip chip interface circuit of a semiconductor memory device
    6.
    发明授权
    Flip chip interface circuit of a semiconductor memory device 失效
    半导体存储器件的倒装芯片接口电路

    公开(公告)号:US07005748B2

    公开(公告)日:2006-02-28

    申请号:US10435024

    申请日:2003-05-12

    IPC分类号: H01L23/48 H01L23/52 H01L29/40

    摘要: A flip chip interface circuit for combining two identical semiconductor chips on upper and lower surfaces of an assembling lead frame into one flip chip package includes at least first and second address pads and first and second bonding option pads formed symmetrically on the chips in a mirror type arrangement to each other. The first and second address pads are input with a signal for selecting operations of the first and second semiconductor chips. The first and second input pad selection and chip selection signals are output in response to signals from the first and second address pads and first and second bonding option pads of the chips, the first and second semiconductor chip selection signals are output in response to the first and second input pad and chip selection signals, and an interface enable signal is output in response to the first and second semiconductor chip selection signals.

    摘要翻译: 一种用于将组装引线框架的上表面和下表面上的两个相同的半导体芯片组合成一个倒装芯片封装的倒装芯片接口电路包括至少第一和第二寻址焊盘以及以镜型对称地形成在芯片上的第一和第二焊接选择焊盘 相互安排 第一和第二地址焊盘输入用于选择第一和第二半导体芯片的操作的信号。 响应于来自第一和第二地址焊盘以及芯片的第一和第二焊接选择焊盘的信号而输出第一和第二输入焊盘选择和芯片选择信号,第一和第二半导体芯片选择信号响应于第一 和第二输入焊盘和芯片选择信号,并且响应于第一和第二半导体芯片选择信号而输出接口使能信号。

    Apparatus and systems using phase change memories
    7.
    发明授权
    Apparatus and systems using phase change memories 有权
    使用相变存储器的装置和系统

    公开(公告)号:US08194442B2

    公开(公告)日:2012-06-05

    申请号:US13091238

    申请日:2011-04-21

    IPC分类号: G11C11/00

    摘要: Apparatus and systems that use phase-change memory devices are provided. The phase-change memory devices may include multiple phase-change memory cells and a reset pulse generation circuit configured to output multiple sequential reset pulses. Each sequential reset pulse is output to a corresponding one of multiple reset lines. Multiple write driver circuits are coupled to corresponding phase change memory cells and to a corresponding one of the reset lines of the reset pulse generation circuit.

    摘要翻译: 提供了使用相变存储器件的装置和系统。 相变存储器件可以包括多个相变存储器单元和被配置为输出多个顺序复位脉冲的复位脉冲发生电路。 每个顺序复位脉冲被输出到多个复位线中相应的一个。 多个写入驱动器电路耦合到相应的相变存储器单元和复位脉冲发生电路的相应的一个复位线。

    Apparatus and systems using phase change memories
    8.
    发明授权
    Apparatus and systems using phase change memories 有权
    使用相变存储器的装置和系统

    公开(公告)号:US07643335B2

    公开(公告)日:2010-01-05

    申请号:US11949342

    申请日:2007-12-03

    IPC分类号: G11C11/00

    摘要: Apparatus and systems that use phase-change memory devices are provided. The phase-change memory devices may include multiple phase-change memory cells and a reset pulse generation circuit configured to output multiple sequential reset pulses. Each sequential reset pulse is output to a corresponding one of multiple reset lines. Multiple write driver circuits are coupled to corresponding phase change memory cells and to a corresponding one of the reset lines of the reset pulse generation circuit.

    摘要翻译: 提供了使用相变存储器件的装置和系统。 相变存储器件可以包括多个相变存储器单元和被配置为输出多个顺序复位脉冲的复位脉冲产生电路。 每个顺序复位脉冲被输出到多个复位线中相应的一个。 多个写入驱动器电路耦合到相应的相变存储器单元和复位脉冲发生电路的相应的一个复位线。