Flash memory device having vertical channel structure
    3.
    发明授权
    Flash memory device having vertical channel structure 有权
    具有垂直通道结构的闪存器件

    公开(公告)号:US08324675B2

    公开(公告)日:2012-12-04

    申请号:US12644976

    申请日:2009-12-22

    IPC分类号: H01L29/76

    摘要: A flash memory device having a vertical channel structure. The flash memory device includes a substrate having a surface that extends in a first direction, a channel region having a pillar shape and extending from the substrate in a second direction that is perpendicular to the first direction, a gate dielectric layer formed around the channel region, a memory cell string comprising a plurality of transistors sequentially formed around the channel region in the second direction, wherein the gate dielectric layer is disposed between the plurality of transistors and the channel region, and a bit line connected to one of the plurality of transistors, and surrounding a side wall and an upper surface of one end of the channel region so as to directly contact the channel region.

    摘要翻译: 一种具有垂直通道结构的闪速存储器件。 闪速存储装置包括:具有沿第一方向延伸的表面的基板,具有柱状的沟道区域,并且在与第一方向垂直的第二方向上从基板延伸;栅极介电层,形成在沟道区域周围 ,包括在所述第二方向上依次形成在所述沟道区周围的多个晶体管的存储单元串,其中所述栅介质层设置在所述多个晶体管和所述沟道区之间,并且位线连接到所述多个晶体管中的一个晶体管 并且围绕通道区域的一端的侧壁和上表面,以便直接接触通道区域。

    FLASH MEMORY DEVICE HAVING VERTICLE CHANNEL STRUCTURE
    4.
    发明申请
    FLASH MEMORY DEVICE HAVING VERTICLE CHANNEL STRUCTURE 有权
    具有垂直通道结构的闪存存储器件

    公开(公告)号:US20110024816A1

    公开(公告)日:2011-02-03

    申请号:US12644976

    申请日:2009-12-22

    IPC分类号: H01L27/088 H01L29/78

    摘要: A flash memory device having a vertical channel structure. The flash memory device includes a substrate having a surface that extends in a first direction, a channel region having a pillar shape and extending from the substrate in a second direction that is perpendicular to the first direction, a gate dielectric layer formed around the channel region, a memory cell string comprising a plurality of transistors sequentially formed around the channel region in the second direction, wherein the gate dielectric layer is disposed between the plurality of transistors and the channel region, and a bit line connected to one of the plurality of transistors, and surrounding a side wall and an upper surface of one end of the channel region so as to directly contact the channel region.

    摘要翻译: 一种具有垂直通道结构的闪速存储器件。 闪速存储装置包括:具有沿第一方向延伸的表面的基板,具有柱状的沟道区域,并且在与第一方向垂直的第二方向上从基板延伸;栅极介电层,形成在沟道区域周围 ,包括在所述第二方向上依次形成在所述沟道区周围的多个晶体管的存储单元串,其中所述栅介质层设置在所述多个晶体管和所述沟道区之间,并且位线连接到所述多个晶体管中的一个晶体管 并且围绕通道区域的一端的侧壁和上表面,以便直接接触通道区域。

    Method of fabricating non-volatile memory device having vertical structure
    5.
    发明授权
    Method of fabricating non-volatile memory device having vertical structure 有权
    制造具有垂直结构的非易失性存储器件的方法

    公开(公告)号:US08133784B2

    公开(公告)日:2012-03-13

    申请号:US12588534

    申请日:2009-10-19

    摘要: A method of fabricating a non-volatile memory device according to an example embodiment may include etching a plurality of sacrificial films and insulation films to form a plurality of first openings that expose a plurality of first portions of a semiconductor substrate. A plurality of channel layers may be formed in the plurality of first openings so as to coat the plurality of first portions of the semiconductor substrate and side surfaces of the plurality of first openings. A plurality of insulation pillars may be formed on the plurality of channel layers so as to fill the plurality of first openings. The plurality of sacrificial films and insulation films may be further etched to form a plurality of second openings that expose a plurality of second portions of the semiconductor substrate. A plurality of side openings may be formed by removing the plurality of sacrificial films. A plurality of gate dielectric films may be formed on surfaces of the plurality of side openings. A plurality of gate electrodes may be formed on the plurality of gate dielectric films so as to fill the plurality of side openings.

    摘要翻译: 根据示例性实施例的制造非易失性存储器件的方法可以包括蚀刻多个牺牲膜和绝缘膜以形成暴露半导体衬底的多个第一部分的多个第一开口。 可以在多个第一开口中形成多个沟道层,以便涂覆半导体衬底的多个第一部分和多个第一开口的侧表面。 可以在多个通道层上形成多个绝缘柱,以填充多个第一开口。 可以进一步蚀刻多个牺牲膜和绝缘膜以形成暴露半导体衬底的多个第二部分的多个第二开口。 可以通过去除多个牺牲膜来形成多个侧开口。 多个栅极电介质膜可以形成在多个侧面开口的表面上。 可以在多个栅极电介质膜上形成多个栅电极,以填充多个侧开口。

    Method of fabricating non-volatile memory device having vertical structure
    6.
    发明申请
    Method of fabricating non-volatile memory device having vertical structure 有权
    制造具有垂直结构的非易失性存储器件的方法

    公开(公告)号:US20100248439A1

    公开(公告)日:2010-09-30

    申请号:US12588534

    申请日:2009-10-19

    IPC分类号: H01L21/336

    摘要: A method of fabricating a non-volatile memory device according to an example embodiment may include etching a plurality of sacrificial films and insulation films to form a plurality of first openings that expose a plurality of first portions of a semiconductor substrate. A plurality of channel layers may be formed in the plurality of first openings so as to coat the plurality of first portions of the semiconductor substrate and side surfaces of the plurality of first openings. A plurality of insulation pillars may be formed on the plurality of channel layers so as to fill the plurality of first openings. The plurality of sacrificial films and insulation films may be further etched to form a plurality of second openings that expose a plurality of second portions of the semiconductor substrate. A plurality of side openings may be formed by removing the plurality of sacrificial films. A plurality of gate dielectric films may be formed on surfaces of the plurality of side openings. A plurality of gate electrodes may be formed on the plurality of gate dielectric films so as to fill the plurality of side openings.

    摘要翻译: 根据示例性实施例的制造非易失性存储器件的方法可以包括蚀刻多个牺牲膜和绝缘膜以形成暴露半导体衬底的多个第一部分的多个第一开口。 可以在多个第一开口中形成多个沟道层,以便涂覆半导体衬底的多个第一部分和多个第一开口的侧表面。 可以在多个通道层上形成多个绝缘柱,以填充多个第一开口。 可以进一步蚀刻多个牺牲膜和绝缘膜以形成暴露半导体衬底的多个第二部分的多个第二开口。 可以通过去除多个牺牲膜来形成多个侧开口。 多个栅极电介质膜可以形成在多个侧面开口的表面上。 可以在多个栅极电介质膜上形成多个栅电极,以填充多个侧开口。

    Code generation and allocation apparatus
    10.
    发明授权
    Code generation and allocation apparatus 失效
    代码生成和分配设备

    公开(公告)号:US07616135B2

    公开(公告)日:2009-11-10

    申请号:US12027317

    申请日:2008-02-07

    IPC分类号: H03M7/00

    摘要: A method of generating and allocating codewords includes allocating one of two selectable codewords b1 and b2 as codeword “b” when a preceding codeword “a” and a following codeword “b” form a code stream X, in which the codewords b1 and b2 have opposite INV values which are parameters indicating whether the number of ‘1s’ contained in a codeword is an odd number or an even number. When the code stream of the preceding codeword “a” and the following codeword b1 is X1, and when the code stream of the preceding codeword “a” and the following codeword b2 is X2, the codewords are allocated such that the INV values of X1 and X2 are maintained to be opposite when the preceding codeword “a” or the following codeword b1 (b2) (b1 or b2) should be replaced by another codeword in compliance with a predetermined boundary condition given between codewords. The codewords are allocated so that a DC suppression capability of the code stream can be maintained.

    摘要翻译: 一种产生和分配码字的方法包括:当前一个码字“a”和随后的码字“b”形成码流X时,将两个可选码字b1和b2之一分配为码字“b”,其中码字b1和b2具有 相反的INV值,其是指示码字中包含的“1”的数目是奇数还是偶数的参数。 当前一个码字“a”的码流和随后的码字b1为X1时,当前一个码字“a”和随后的码字b2的码流为X2时,分配码字,使得X1的INV值 并且当前面的码字“a”或者随后的码字b1(b2)(b1或b2)应该被替换为符合在码字之间给定的预定边界条件的另一码字时,X2被维持为相反。 分配码字使得能够维持码流的DC抑制能力。