公开(公告)号：US20220318985A1

公开(公告)日：2022-10-06

申请号：US17631423

申请日：2021-03-24

Applicant: System Square Inc.

Inventor： Sachihiro NAKAGAWA

IPC: G06T7/00 ,  G01N23/04

Abstract: A training data generation device includes: cut-out unit that receives an input of an image of an inspection target, specifies an inspection area of the inspection target in the image by a predetermined method, and cuts out the specified inspection area from the image; sorting unit that, on the basis of a sorting operation of sorting, as a learning-target image, an image of the inspection area cut out in the cut-out unit into at least either normal or non-normal, associates the learning-target image and a result of the sorting with each other; and training data memory unit that stores training data in which the learning-target image and the result of the sorting are associated with each other.

公开(公告)号：US20220067434A1

公开(公告)日：2022-03-03

申请号：US17281228

申请日：2019-09-20

Applicant: SYSTEM SQUARE INC.

Inventor： Sachihiro NAKAGAWA

IPC: G06K9/62 ,  G06T7/00 ,  G06N20/00

Abstract: A training data generation device that can rapidly generate a large amount of training data to be input into a learning program is provided. The training data generation device generates training data to be used in machine learning. A learned model generated by the machine learning using the training data generated by the training data generation device is used in an inspection device that performs inspection for determining whether or not an inspection target is a normal product by inputting an image capturing the inspection target into the learned model. The training data generation device includes the following: a determination-target image extraction unit that extracts, from an input image capturing the inspection target, one or more determination-target images containing a determination target that satisfies a predetermined condition; a sorting unit that associates, on the basis of a sorting operation of sorting the inspection target captured in the determination-target image into either a normal product or a non-normal product, each of the determination-target images and a result of the sorting with each other; and a training data memory unit that stores training data in which each of the determination-target images and a result of the sorting are associated with each other.

公开(公告)号：US20190212464A1

公开(公告)日：2019-07-11

申请号：US16334350

申请日：2017-09-20

Applicant: System Square Inc.

Inventor： Noriaki IKEDA ,  Sachihiro NAKAGAWA

IPC: G01V5/00

CPC classification number: G01V5/0016 ,  G01N23/04 ,  G01N23/18 ,  G01T1/17 ,  G01T1/36

Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).