公开(公告)号：US20150241341A1

公开(公告)日：2015-08-27

申请号：US14680460

申请日：2015-04-07

Applicant: System Square Inc.

Inventor： Noriaki IKEDA

IPC: G01N21/3581 ,  H04N5/33 ,  H04N5/32 ,  G01V5/00 ,  G01N21/84

CPC classification number: G01N21/3581 ,  B65B57/10 ,  G01N21/84 ,  G01N21/90 ,  G01N23/10 ,  G01N33/02 ,  G01N2021/845 ,  G01V5/0016 ,  H04N5/32 ,  H04N5/33

Abstract: A package inspection system includes a conveyor mechanism 6, an X-ray generator 10 applying X rays to a package W1 conveyed by the conveyor mechanism 6, an X-ray sensor 13, and an optical sensor 15. First image data showing the outline of the content of the package W1 are generated based on detection output from the X-ray sensor 13. Second image data showing the outline of the wrapping of the package W1 are generated based on detection output from an optical sensor 15. The relative position of the wrapping and the content is determined based on the first and second image data, so that failures, e.g., the content caught in a seal of the wrapping can be detected accurately. The package inspection system can accurately determine a position of a wrapping and the content of a package even if a package has a light non-transmissive wrapping.

Abstract translation: 包装检查系统包括输送机构6，将X射线施加到由输送机构6输送的包装W1，X射线传感器13和光学传感器15的X射线发生器10。 根据来自X射线传感器13的检测输出来生成包装W1的内容。基于来自光学传感器15的检测输出，生成表示包装W1的包装轮廓的第二图像数据。 并且基于第一和第二图像数据确定内容，使得可以准确地检测到诸如被卷入包装的密封件中的内容的故障。 包装检查系统可以精确地确定包装的位置和包装的内容物，即使包装具有轻的非透明包装。

公开(公告)号：US20190212464A1

公开(公告)日：2019-07-11

申请号：US16334350

申请日：2017-09-20

Applicant: System Square Inc.

Inventor： Noriaki IKEDA ,  Sachihiro NAKAGAWA

IPC: G01V5/00

CPC classification number: G01V5/0016 ,  G01N23/04 ,  G01N23/18 ,  G01T1/17 ,  G01T1/36

Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).

公开(公告)号：US20200241150A1

公开(公告)日：2020-07-30

申请号：US16756843

申请日：2017-10-24

Applicant: System Square Inc.

Inventor： Noriaki IKEDA ,  Junji MORIYAMA

IPC: G01T1/16 ,  H01L27/146 ,  G01T1/29

Abstract: An electromagnetic wave detection module in which wiring is formed to connect each detection element of an electromagnetic wave detection means configured by arranging a plurality of detection elements for detecting an electromagnetic wave in a two-dimensional array and a predetermined connection destination outside the electromagnetic wave detection means with good manufacturability and so as not to cause trouble in the detection of an electromagnetic wave as much as possible. A detection element group includes M detection elements (M is an integer of 2 or more) arranged in the Y-axis direction is arranged in N rows (N is an integer of 2 or more) in the X-axis direction orthogonal to the Y-axis direction, and M×N wirings electrically connecting each of the M×N detection elements and a predetermined connection destination outside any one end of the electromagnetic wave detection means in the Y-axis direction are provided on the common substrate surface.

公开(公告)号：US20150179391A1

公开(公告)日：2015-06-25

申请号：US14642736

申请日：2015-03-09

Applicant: System Square Inc.

Inventor： Noriaki IKEDA ,  Kazunori Yamada

IPC: H01J35/16 ,  G01N23/04 ,  H01J35/02 ,  G01V5/00

CPC classification number: H01J35/16 ,  G01N23/04 ,  G01N2223/652 ,  G01V5/0016 ,  H01J35/025 ,  H01J2235/127 ,  H05G1/025

Abstract: An X-ray inspection system of the present application is capable of blocking the effect of heat from an X-ray source, thereby making it possible to place a heat-sensitive circuit component in the same housing space as the X-ray source. The X-ray inspection system includes a housing 10 provided with an upper housing space 11, in which an X-ray source 32 housed in a cooling container 30 is placed. Due to pressure of a pump 36, a cooling medium circulates between the cooling container 30 and a heat radiating device 33, thereby suppressing the temperature rise of the cooling container 30. Since the cooling container 30 is placed in the upper housing space 11, the upper housing space 11 serves as a cooling space, suppressing the temperature rise. Therefore, heat-sensitive or heat-producing circuit components can be placed in the upper housing space 11.

Abstract translation: 本申请的X射线检查系统能够阻挡来自X射线源的热量的影响，从而可以将热敏电路部件放置在与X射线源相同的容纳空间中。 X射线检查系统包括设置有容纳在冷却容器30中的X射线源32的上部容纳空间11的壳体10。 由于泵36的压力，冷却介质在冷却容器30和散热装置33之间循环，从而抑制冷却容器30的温升。由于冷却容器30被放置在上容纳空间11中， 上容纳空间11用作冷却空间，抑制温度升高。 因此，可以将热敏或发热电路部件放置在上容纳空间11中。