公开(公告)号：US20080228417A1

公开(公告)日：2008-09-18

申请号：US11864939

申请日：2007-09-29

申请人： TADAHIKO BABA ,  Hirokatsu Niijima

发明人： TADAHIKO BABA ,  Hirokatsu Niijima

IPC分类号： G01R29/26 ,  G06F19/00

CPC分类号： G01R31/31709 ,  G01R29/26 ,  H03K5/1534

摘要： A changing point detection circuit is provided that detects timing of changing points at which a logic value of a signal under measurement changes and includes a multi-strobe circuit generating a logic value data string obtained by detecting a logic value of the signal under measurement according to a plurality of strobes, each strobe having a different phase; a changing point detecting section detecting in which strobe the logic value changes based on the logic value data string; an edge designation storage section storing in advance information concerning whether an edge-type of the changing point to be detected is a rising edge or a falling edge of the signal under measurement; a selecting section selecting the changing point corresponding to the edge-type stored by the edge designation storage section from among the changing points detected by the changing point detecting section; and a strobe place storage section storing information concerning which strobe the changing point selected by the selecting section corresponds to.

摘要翻译： 提供了一种改变点检测电路，其检测测量信号的逻辑值改变的点的定时，并且包括多选通电路，其产生通过根据测量信号检测被测信号的逻辑值而获得的逻辑值数据串 多个选通，每个选通具有不同的相位; 变更点检测部，根据所述逻辑值数据串检测所述逻辑值在哪个选通脉冲中变化的变化点; 边缘指定存储部分，预先存储关于被检测的切换点的边缘类型是被测信号的上升沿还是下降沿的信息; 选择部分，从由变化点检测部分检测的变化点中选择与由边缘指定存储部分存储的边缘类型对应的变化点; 以及选通存储部，其存储与所述选择部选择的所述变化点对应的选通的信息。

公开(公告)号：US20100207650A1

公开(公告)日：2010-08-19

申请号：US12370609

申请日：2009-02-13

申请人： TADAHIKO BABA ,  HIROSHI KUROSAKI

发明人： TADAHIKO BABA ,  HIROSHI KUROSAKI

IPC分类号： G01R31/02 ,  G01R31/14

CPC分类号： G01R31/31937 ,  G01R31/31922

摘要： Provided is a test apparatus for testing a device under test, comprising a multi-strobe generating section that generates, for each prescribed test cycle, a multi-strobe that includes a plurality of strobes arranged at prescribed time intervals; a data detecting section that detects a logic value of a response signal output by the device under test, according to each strobe; and a data width detecting section that detects a data width indicating a period during which the logic value of the response signal matches a prescribed expected value, based on each change point of a logic value output by the data detecting section.

摘要翻译： 提供了一种用于测试被测器件的测试装置，包括：多选通产生部分，用于在每个规定的测试周期产生包括以预定时间间隔布置的多个选通的多次选通; 数据检测部分，根据每个选通信号，检测被被测设备输出的响应信号的逻辑值; 以及数据宽度检测部，其基于由数据检测部输出的逻辑值的每个变化点来检测表示响应信号的逻辑值与规定的期望值相匹配的期间的数据宽度。