CONTACT PROBE FOR A TESTING HEAD
    1.
    发明申请
    CONTACT PROBE FOR A TESTING HEAD 审中-公开
    联系人测试头

    公开(公告)号:US20170059612A1

    公开(公告)日:2017-03-02

    申请号:US15352448

    申请日:2016-11-15

    Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.

    Abstract translation: 电子装置的测试装置的测试头的接触探针包括适于接触相应接触垫的相应端部和在端部之间基本上沿纵向方向延伸的本体,至少一个端部包括由第一 所述导电材料具有大于第二导电材料的硬度,所述导电材料使所述接触探针由所述端部的一部分支撑,所述部分由所述第二导电材料制成并且相对于所述插入件以互补的方式成形,并具有 相应的邻接表面面向并粘附到插入件的相应的邻接表面。

    CONTACT PROBE FOR A TESTING HEAD
    2.
    发明申请

    公开(公告)号:US20170269125A1

    公开(公告)日:2017-09-21

    申请号:US15309776

    申请日:2016-03-09

    Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.

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