-
公开(公告)号：US20230288447A1
公开(公告)日：2023-09-14
申请号：US18005880
申请日：2021-07-08
Applicant: TECHNOPROBE S.P.A.
Inventor： Stefano FELICI , Fabio MORGANA , Roberto CRIPPA
CPC classification number: G01R1/06738 , G01R1/06761 , H01R13/2492
Abstract: A contact probe for a probe head for test equipment of electronic devices is provided. The contact probe includes a first end portion and a second end portion configured to realize a contact with suitable contact structures, and a body portion extended along a longitudinal development axis between respective the first and second end portions. The first end portion includes a base portion, a peripherally protruding element protruding from the base portion, and a hollow part having a base at a surface of the base portion and being surrounded by the peripherally protruding element. In addition, the peripherally protruding element is configured to penetrate into the contact structures.
-
公开(公告)号：US20200072873A1
公开(公告)日：2020-03-05
申请号：US16677581
申请日：2019-11-07
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto CRIPPA , Flavio MAGGIONI , Raffaele VALLAURI
Abstract: A method of manufacturing a multi-layer for a probe card comprises providing first contact pads on an exposed face of a first dielectric layer and second contact pads on an exposed face of a last dielectric layer. Each dielectric layer is laser ablated to realize pass-through structures and the pass-through structures are conductively filled to realize conductive structures. The dielectric layers are superimposed in a way that each conductive structure contacts a corresponding conductive structure of a contiguous dielectric layer in the multi-layer and forms conductive paths electrically connected the first and second contact pads. The second contact pads having a greater distance between its symmetry centers than the first contact pads, the multi-layer thus performing a spatial transformation between the first and second contact pads connected through the connective paths.
-
公开(公告)号：US20170059612A1
公开(公告)日：2017-03-02
申请号：US15352448
申请日：2016-11-15
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Giuseppe CRIPPA , Raffaele VALLAURI
CPC classification number: G01R1/06738 , G01R1/06716 , G01R1/06755 , G01R1/06761 , G01R1/073 , G01R1/07314 , G01R1/07357 , H01R13/03 , H01R13/2464
Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.
Abstract translation: 电子装置的测试装置的测试头的接触探针包括适于接触相应接触垫的相应端部和在端部之间基本上沿纵向方向延伸的本体，至少一个端部包括由第一 所述导电材料具有大于第二导电材料的硬度，所述导电材料使所述接触探针由所述端部的一部分支撑，所述部分由所述第二导电材料制成并且相对于所述插入件以互补的方式成形，并具有 相应的邻接表面面向并粘附到插入件的相应的邻接表面。
-
公开(公告)号：US20220155348A1
公开(公告)日：2022-05-19
申请号：US17591363
申请日：2022-02-02
Applicant: Technoprobe, S.p.A.
Inventor： Roberto CRIPPA
Abstract: A probe head for a test equipment of electronic devices comprises a plurality of contact probes inserted in guide holes provided in at least one upper guide and one lower guide, a bending area for the contact probes being defined between the upper and lower guides, each contact probe having at least one first terminal portion which protrudes of a first length from the lower guide and ends with a contact tip (22A) adapted to abut onto a respective contact pad of a device to be tested, as well as a second terminal portion which protrudes of a second length from the upper guide and ends with a contact head adapted to abut onto a contact pad of a board for connecting or interfacing with the test equipment, suitably comprising at least one protection structure projecting from the upper guide in direction of a longitudinal development axis of the contact probes towards the board, the protection structure thus extending in correspondence of the contact heads of the contact probes.
-
公开(公告)号：US20200271692A1
公开(公告)日：2020-08-27
申请号：US16870794
申请日：2020-05-08
Applicant: Technoprobe S.p.A.
Inventor： Roberto CRIPPA , Flavio MAGGIONI , Andrea CALAON
IPC: G01R1/073
Abstract: A contact probe for a testing head of an apparatus for testing electronic devices comprises a body extending along a longitudinal axis between a first end portion and a second end portion, the second end portion being adapted to contact pads of a device under test. Suitably, the contact probe comprises a first section, which extends along the longitudinal axis from the first end portion and is made of an electrically non-conductive material, and a second section, which extends along the longitudinal axis from the second end portion up to the first section, the second section being electrically conductive and extending over a distance less than 1000 μm.
-
Patent Agency Ranking
公开(公告)号：US20190113539A1
公开(公告)日：2019-04-18
申请号：US16219783
申请日：2018-12-13
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Stefano FELICI
Abstract: A probe card for testing of electronic devices comprises a testing head with plural contact probes inserted into guide holes of an upper guide and a lower guide, and a space transformer, each of the contact probes having a first terminal portion projecting from the lower guide with a first length and ending with a contact tip adapted to abut onto a respective contact pad of a device to be tested, and a second terminal portion projecting from the upper guide with a second length and ending with a contact head adapted to abut onto a contact pad of the space transformer. The probe card comprises a spacer element interposed between the space transformer and the upper guide and removable to adjust the first length of the first terminal portion by changing the second length of the second terminal portion and approaching the upper guide and the space transformer.
-
公开(公告)号：US20230021227A1
公开(公告)日：2023-01-19
申请号：US17783440
申请日：2020-12-17
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Stefano FELICI
Abstract: A probe head for a testing apparatus integrated on a semiconductor wafer is disclosed having a first plurality of contact probes having a first transversal diameter, a second plurality of micro contact probes having a second transversal diameter, smaller than the first transversal diameter, and a flexible membrane having conductive tracks for connecting a first plurality contact probe with a corresponding second plurality micro contact probe. The second plurality contact probes are arranged between the testing apparatus and the flexible membrane, and the second plurality micro contact probes are arranged between the flexible membrane and a semiconductor wafer. The second plurality micro contact probes are configured to abut onto contact pads of a device under test integrated in the semiconductor wafer, with each first plurality contact probe being in contact with a corresponding second plurality micro contact probe through a conductive track of the flexible membrane to connect the device under test with the testing apparatus.
-
公开(公告)号：US20190293686A1
公开(公告)日：2019-09-26
申请号：US16439527
申请日：2019-06-12
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Raffaele VALLAURI
Abstract: A contact probe comprises a probe body being extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body. Suitably, the end portion comprises at least one indentation adapted to house a material scrap being on the contact probe after a separation from a substrate wherein the contact probe has been realized.
-
公开(公告)号：US20170269125A1
公开(公告)日：2017-09-21
申请号：US15309776
申请日：2016-03-09
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Giuseppe CRIPPA , Raffaele VALLAURI
IPC: G01R1/067
CPC classification number: G01R1/06738 , G01R1/06716 , G01R1/06755 , G01R1/06761 , G01R1/073 , G01R1/07314 , G01R1/07357 , H01R13/03 , H01R13/2464
Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.
-
公开(公告)号：US20240044940A1
公开(公告)日：2024-02-08
申请号：US18254056
申请日：2021-11-22
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Flavio MAGGIONI
CPC classification number: G01R1/07307 , G01R1/06738
Abstract: A contact probe is disclosed having a first contact end portion adapted to abut onto a contact pad of a device under test, a second contact end portion adapted to abut onto a contact pad of a PCB board of a testing apparatus, and a rod-shaped probe body extended between the first and second contact end portions according to a longitudinal direction. The contact probe also includes an opening that extends along the probe body and along at least one contact end portion, a first opening part defining a pair of arms in the probe body and a second opening part defining a pair of end sections in the contact end portion.
-
-
-
-
-
-
-
-
-
Search Results
15
records
(took 0.009 seconds)
