ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDDED DEVICES
    1.
    发明申请
    ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDDED DEVICES 有权
    片上模拟数字转换器(ADC)嵌入式设备的线性文本

    公开(公告)号:US20150249458A1

    公开(公告)日:2015-09-03

    申请号:US14193669

    申请日:2014-02-28

    Abstract: A method for testing linearity of an ADC, comprising receiving a trigger signal indicating an ADC input voltage step adjustment, reading an ADC output sample upon receiving the trigger signal, wherein the ADC output sample has a value range of N integer values that correspond to N discrete ADC output codes, computing a histogram of code occurrences for M consecutive ADC output codes, wherein the histogram comprises M number of bins corresponding to the M consecutive ADC output codes, and wherein M is less than N, updating a DNL value and an INL value according to the histogram at an interval of K number of ADC output sample readings, and shifting the histogram by one ADC output code after updating the DNL and the INL values.

    Abstract translation: 一种用于测试ADC的线性度的方法,包括接收指示ADC输入电压阶跃调整的触发信号,在接收到所述触发信号时读取ADC输出采样,其中所述ADC输出采样具有对应于N的N个整数值的值范围 离散ADC输出代码,计算M个连续ADC输出代码的代码发生的直方图,其中所述直方图包括M个对应于M个连续ADC输出代码的仓,并且其中M小于N,更新DNL值和INL 根据直方图的值,以K个ADC输出采样读数的间隔,并在更新DNL和INL值之后将直方图移位一个ADC输出代码。

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