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公开(公告)号:US10649865B2
公开(公告)日:2020-05-12
申请号:US15991127
申请日:2018-05-29
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jasbir Singh Nayyar , Shashank Srinivasa Nuthakki , Rahul Gulati , Arun Shrimali
Abstract: An integrated circuit (IC) chip can include a given core at a position in the IC chip that defines a given orientation, wherein the given core is designed to perform a particular function. The IC chip can include another core designed to perform the particular function. The other core can be flipped and rotated by 180 degrees relative to the given core such that the other core is asymmetrically oriented with respect to the given core. The IC chip can also include a compare unit configured to compare outputs of the given core and the other core to detect a fault in the IC chip.
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公开(公告)号:US11698841B2
公开(公告)日:2023-07-11
申请号:US17585979
申请日:2022-01-27
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jasbir Singh Nayyar , Shashank Srinivasa Nuthakki , Rahul Gulati , Arun Shrimali
CPC classification number: G06F11/16 , G06F11/004 , G06F11/1641 , G06F30/39 , H01L28/00 , G06F11/1679 , H01L23/562
Abstract: An integrated circuit (IC) chip can include a given core at a position in the IC chip that defines a given orientation, wherein the given core is designed to perform a particular function. The IC chip can include another core designed to perform the particular function. The other core can be flipped and rotated by 180 degrees relative to the given core such that the other core is asymmetrically oriented with respect to the given core. The IC chip can also include a compare unit configured to compare outputs of the given core and the other core to detect a fault in the IC chip.
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公开(公告)号:US11269742B2
公开(公告)日:2022-03-08
申请号:US16838176
申请日:2020-04-02
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jasbir Singh Nayyar , Shashank Srinivasa Nuthakki , Rahul Gulati , Arun Shrimali
Abstract: An integrated circuit (IC) chip can include a given core at a position in the IC chip that defines a given orientation, wherein the given core is designed to perform a particular function. The IC chip can include another core designed to perform the particular function. The other core can be flipped and rotated by 180 degrees relative to the given core such that the other core is asymmetrically oriented with respect to the given core. The IC chip can also include a compare unit configured to compare outputs of the given core and the other core to detect a fault in the IC chip.
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公开(公告)号:US20180285218A1
公开(公告)日:2018-10-04
申请号:US15991127
申请日:2018-05-29
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jasbir Singh Nayyar , Shashank Srinivasa Nuthakki , Rahul Gulati , Arun Shrimali
Abstract: An integrated circuit (IC) chip can include a given core at a position in the IC chip that defines a given orientation, wherein the given core is designed to perform a particular function. The IC chip can include another core designed to perform the particular function. The other core can be flipped and rotated by 180 degrees relative to the given core such that the other core is asymmetrically oriented with respect to the given core. The IC chip can also include a compare unit configured to compare outputs of the given core and the other core to detect a fault in the IC chip.
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公开(公告)号:US10002056B2
公开(公告)日:2018-06-19
申请号:US14854900
申请日:2015-09-15
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jasbir Singh Nayyar , Shashank Srinivasa Nuthakki , Rahul Gulati , Arun Shrimali
CPC classification number: G06F11/16 , G06F11/004 , G06F11/1641 , G06F11/1679 , G06F17/5068 , H01L23/562 , H01L28/00
Abstract: An integrated circuit (IC) chip can include a given core at a position in the IC chip that defines a given orientation, wherein the given core is designed to perform a particular function. The IC chip can include another core designed to perform the particular function. The other core can be flipped and rotated by 180 degrees relative to the given core such that the other core is asymmetrically oriented with respect to the given core. The IC chip can also include a compare unit configured to compare outputs of the given core and the other core to detect a fault in the IC chip.
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