公开(公告)号：US11421981B2

公开(公告)日：2022-08-23

申请号：US16566140

申请日：2019-09-10

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Hung-Yu Chou ,  Chien-Hao Wang ,  Tse-Tsun Chiu ,  Fu-Kang Lee ,  Liang-Kang Su

IPC: G01B11/06 ,  G01B11/30 ,  G01B11/28 ,  G01B11/16 ,  G01N21/00 ,  G01N21/55 ,  G01R31/00

Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.

公开(公告)号：US20200003548A1

公开(公告)日：2020-01-02

申请号：US16566140

申请日：2019-09-10

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Hung-Yu Chou ,  Chien-Hao Wang ,  Tse-Tsun Chiu ,  Fu-Kang Lee ,  Liang-Kang Su

IPC: G01B11/06 ,  G01B11/30 ,  G01B11/28 ,  G01B11/16

Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.

公开(公告)号：US10429174B2

公开(公告)日：2019-10-01

申请号：US15848157

申请日：2017-12-20

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Hung-Yu Chou ,  Chien-Hao Wang ,  Tse-Tsun Chiu ,  Fu-Kang Lee ,  Liang-Kang Su

IPC: G01B11/06 ,  G01B11/30 ,  G01B11/28 ,  G01B11/16

Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.