公开(公告)号：US11961220B2

公开(公告)日：2024-04-16

申请号：US15925008

申请日：2018-03-19

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Neeraj Bhardwaj ,  Neha Vernekar ,  Janardhan Venkata Raju ,  Shubham Mehrotra ,  Arun Adoni ,  Mahit Arun Warhadpande ,  Shimee Gupta ,  Goda Devi Addanki ,  Pavinkumar Ramasamy ,  Binoy Jose Maliakal

IPC分类号： G01R31/20 ,  G01R1/04 ,  G01R31/28 ,  G06T7/00

CPC分类号： G06T7/0008 ,  G01R1/0441 ,  G01R31/2887 ,  G01R31/2893

摘要： Apparatuses and methods are disclosed for handling integrated circuits in automated testing. The handler apparatus includes an upper assembly that is selectively translatable above a testing surface and a lower bracket extending from and positioned below the upper assembly. The lower bracket forms a first opening, is selectively moveable upward and downward, and includes a rotatable finger extending downward to pick up and place an integrated circuit in a socket. The handier may further include an image sensor to detect potential error conditions, and a tool extending from the lower bracket to open and close a lid on the socket. The methods include sensing an image of an integrated circuit during certain phases of testing, analyzing the image to determine if the integrated circuit is positioned correctly, and correcting any detected error conditions before continuing with the automated testing.

公开(公告)号：US20190227117A1

公开(公告)日：2019-07-25

申请号：US15925008

申请日：2018-03-19

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Neeraj Bhardwaj ,  Neha Vernekar ,  Janardhan Venkata Raju ,  Shubham Mehrotra ,  Arun Adoni ,  Mahit Arun Warhadpande ,  Shimee Gupta ,  Goda Devi Addanki ,  Pavinkumar Ramasamy ,  Binoy Jose Maliakal

IPC分类号： G01R31/28 ,  G01R1/04 ,  G06K9/20

摘要： Apparatuses and methods are disclosed for handling integrated circuits in automated testing. The handler apparatus includes an upper assembly that is selectively translatable above a testing surface and a lower bracket extending from and positioned below the upper assembly. The lower bracket forms a first opening, is selectively moveable upward and downward, and includes a rotatable finger extending downward to pick up and place an integrated circuit in a socket. The handier may further include an image sensor to detect potential error conditions, and a tool extending from the lower bracket to open and dose a lid on the socket. The methods include sensing an image of an integrated circuit during certain phases of testing, analyzing the image to determine if the integrated circuit is positioned correctly, and correcting any detected error conditions before continuing with the automated testing.