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公开(公告)号：US20200033397A1
公开(公告)日：2020-01-30
申请号：US16523758
申请日：2019-07-26
发明人： William Joshua Bush , Neeraj Bhardwaj , Erfan Shirazian , Madhusudan Sampath , Pavinkumar Ramasamy
IPC分类号： G01R31/28
摘要： A nontransitory computer-readable program storage medium storing program instructions. The program, when executed by a processor, has the processor capable of receiving a set of input data, the input data relating to devices on a test board for testing a device under test. The program, when executed by a processor, also is capable of transforming the set of input data into test board mapping data. The test board mapping data comprises an ordered listing of potential test points along a path that couples to a conductive surface, wherein the potential test points are derived from at least one of the test board attributes. Further, the program, when executed by a processor, is capable of identifying a selected test point from among the one or more potential test points, the selected test point for spike check probing of the device under test.
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公开(公告)号：US11961220B2
公开(公告)日：2024-04-16
申请号：US15925008
申请日：2018-03-19
发明人： Neeraj Bhardwaj , Neha Vernekar , Janardhan Venkata Raju , Shubham Mehrotra , Arun Adoni , Mahit Arun Warhadpande , Shimee Gupta , Goda Devi Addanki , Pavinkumar Ramasamy , Binoy Jose Maliakal
CPC分类号： G06T7/0008 , G01R1/0441 , G01R31/2887 , G01R31/2893
摘要： Apparatuses and methods are disclosed for handling integrated circuits in automated testing. The handler apparatus includes an upper assembly that is selectively translatable above a testing surface and a lower bracket extending from and positioned below the upper assembly. The lower bracket forms a first opening, is selectively moveable upward and downward, and includes a rotatable finger extending downward to pick up and place an integrated circuit in a socket. The handier may further include an image sensor to detect potential error conditions, and a tool extending from the lower bracket to open and close a lid on the socket. The methods include sensing an image of an integrated circuit during certain phases of testing, analyzing the image to determine if the integrated circuit is positioned correctly, and correcting any detected error conditions before continuing with the automated testing.
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公开(公告)号：US11454665B2
公开(公告)日：2022-09-27
申请号：US16523758
申请日：2019-07-26
发明人： William Joshua Bush , Neeraj Bhardwaj , Erfan Shirazian , Madhusudan Sampath , Pavinkumar Ramasamy
摘要： A nontransitory computer-readable program storage medium storing program instructions. The program, when executed by a processor, has the processor capable of receiving a set of input data, the input data relating to devices on a test board for testing a device under test. The program, when executed by a processor, also is capable of transforming the set of input data into test board mapping data. The test board mapping data comprises an ordered listing of potential test points along a path that couples to a conductive surface, wherein the potential test points are derived from at least one of the test board attributes. Further, the program, when executed by a processor, is capable of identifying a selected test point from among the one or more potential test points, the selected test point for spike check probing of the device under test.
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公开(公告)号：US20200033403A1
公开(公告)日：2020-01-30
申请号：US16523720
申请日：2019-07-26
发明人： William Joshua Bush , Neeraj Bhardwaj , Erfan Shirazian , Madhusudan Sampath , James Scott Mason , Yazdi Contractor , Pavinkumar Ramasamy
摘要： Apparatus for cooperating with a stationary integrated circuit test board. The apparatus includes a frame for positioning relative to a stationary integrated circuit test board, where the test board is for coupling to an integrated circuit device under test. The apparatus also includes a probe having a tip, and a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the integrated circuit test board.
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公开(公告)号：US20190227117A1
公开(公告)日：2019-07-25
申请号：US15925008
申请日：2018-03-19
发明人： Neeraj Bhardwaj , Neha Vernekar , Janardhan Venkata Raju , Shubham Mehrotra , Arun Adoni , Mahit Arun Warhadpande , Shimee Gupta , Goda Devi Addanki , Pavinkumar Ramasamy , Binoy Jose Maliakal
摘要： Apparatuses and methods are disclosed for handling integrated circuits in automated testing. The handler apparatus includes an upper assembly that is selectively translatable above a testing surface and a lower bracket extending from and positioned below the upper assembly. The lower bracket forms a first opening, is selectively moveable upward and downward, and includes a rotatable finger extending downward to pick up and place an integrated circuit in a socket. The handier may further include an image sensor to detect potential error conditions, and a tool extending from the lower bracket to open and dose a lid on the socket. The methods include sensing an image of an integrated circuit during certain phases of testing, analyzing the image to determine if the integrated circuit is positioned correctly, and correcting any detected error conditions before continuing with the automated testing.
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