公开(公告)号：US20240337686A1

公开(公告)日：2024-10-10

申请号：US18478038

申请日：2023-09-29

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Tanmay Neema ,  Kanak Das ,  Rajavelu Thinakaran ,  Gautam Nandi

IPC: G01R31/28 ,  H03F3/45 ,  H03M1/66

CPC classification number: G01R31/2879 ,  G01R31/2889 ,  H03F3/45475 ,  H03M1/662 ,  H03F2200/261

Abstract: The techniques and circuits, described herein, include solutions for error compensation in source measurement units (SMUs). An example SMU is capable of both sourcing current to a device under test (DUT) and measuring current through the DUT. An SMU may include a sensing resistor coupled in series with the DUT. A voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the DUT. In practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. A gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the DUT can be sourced and measured.