公开(公告)号：US20190186897A1

公开(公告)日：2019-06-20

申请号：US15848157

申请日：2017-12-20

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Hung-Yu CHOU ,  Chien-Hao WANG ,  Tse-Tsun CHIU ,  Fu-Kang LEE ,  Liang-Kang SU

IPC: G01B11/06 ,  G01B11/16 ,  G01B11/28 ,  G01B11/30

CPC classification number: G01B11/0625 ,  G01B11/162 ,  G01B11/285 ,  G01B11/303 ,  G01N21/00

Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.