Clock shaper circuit for transition fault testing

    公开(公告)号:US11604221B1

    公开(公告)日:2023-03-14

    申请号:US17566190

    申请日:2021-12-30

    Abstract: An integrated circuit for transition fault testing comprises a synchronizing circuit including a first set of shift registers coupled to receive a scan enable signal and to provide a synchronizing signal based on the scan enable signal; a clock leaker circuit coupled to the synchronizing circuit and including a second set of shift registers coupled to receive a first clock signal based on the synchronizing signal and to provide a second clock signal that includes a set of pulses; and a multiplexer (MUX) that includes a first input coupled to receive a shift clock, a second input coupled to the clock leaker circuit to receive the second clock signal, and an output configured to provide an output clock signal that includes a second set of pulses.

    Clock shaper circuit for transition fault testing

    公开(公告)号:US12216160B2

    公开(公告)日:2025-02-04

    申请号:US18182848

    申请日:2023-03-13

    Abstract: An integrated circuit for transition fault testing comprises a synchronizing circuit including a first set of shift registers coupled to receive a scan enable signal and to provide a synchronizing signal based on the scan enable signal; a clock leaker circuit coupled to the synchronizing circuit and including a second set of shift registers coupled to receive a first clock signal based on the synchronizing signal and to provide a second clock signal that includes a set of pulses; and a multiplexer (MUX) that includes a first input coupled to receive a shift clock, a second input coupled to the clock leaker circuit to receive the second clock signal, and an output configured to provide an output clock signal that includes a second set of pulses.

    CLOCK SHAPER CIRCUIT FOR TRANSITION FAULT TESTING

    公开(公告)号:US20230243887A1

    公开(公告)日:2023-08-03

    申请号:US18182848

    申请日:2023-03-13

    CPC classification number: G01R31/31727 H03K19/20 G11C19/287 G01R31/3177

    Abstract: An integrated circuit for transition fault testing comprises a synchronizing circuit including a first set of shift registers coupled to receive a scan enable signal and to provide a synchronizing signal based on the scan enable signal; a clock leaker circuit coupled to the synchronizing circuit and including a second set of shift registers coupled to receive a first clock signal based on the synchronizing signal and to provide a second clock signal that includes a set of pulses; and a multiplexer (MUX) that includes a first input coupled to receive a shift clock, a second input coupled to the clock leaker circuit to receive the second clock signal, and an output configured to provide an output clock signal that includes a second set of pulses.

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