CONTROLLING CURRENT LIMITS IN CURRENT LIMITING CIRCUITS

    公开(公告)号:US20180262184A1

    公开(公告)日:2018-09-13

    申请号:US15857135

    申请日:2017-12-28

    CPC classification number: H03K5/086 G05F1/46 G05F1/573

    Abstract: An example current limiting apparatus comprises a first transistor to carry a first current; a sense transistor coupled to the first transistor, the sense transistor to carry a sense current that is a function of the first current; a first amplifier coupled to the first transistor and the sense transistor, the amplifier to achieve a common voltage potential on terminals of the first and the sense transistors; a second amplifier coupled to the first amplifier and the sense transistor, the second amplifier to control the first and sense transistors based on the sense current; and a circuit coupled to the first and second amplifiers, the circuit to control an input to the second amplifier based on an input to the first amplifier such that a current limit of the first transistor remains below a programmed current limit of the first transistor.

    TURN ON DELAY MEASUREMENTS FOR CAPACITIVE LOAD

    公开(公告)号:US20240283350A9

    公开(公告)日:2024-08-22

    申请号:US17891456

    申请日:2022-08-19

    CPC classification number: H02M1/08

    Abstract: One example includes a testing method that includes connecting a capacitor having a first capacitance to an output terminal of an integrated circuit (IC). The method can also include generating pulse signal responsive to an enable signal provided at at least one input terminal of the IC and providing a drive signal to the output terminal to cause a linearly increasing voltage across the capacitor responsive to the pulse signal. The method can also include measuring a no-load delay. The method can also include measuring the linearly increasing voltage at the output terminal responsive to the drive signal. The method can also include determining a first capacitance charge time for the capacitor responsive to the linearly increasing voltage reaching a threshold and determining a second capacitance charge delay for a second capacitance based on the first capacitance charge time and the no-load delay.

    TURN ON DELAY MEASUREMENTS FOR CAPACITIVE LOAD

    公开(公告)号:US20230072953A1

    公开(公告)日:2023-03-09

    申请号:US17891456

    申请日:2022-08-19

    Abstract: One example includes a testing method that includes connecting a capacitor having a first capacitance to an output terminal of an integrated circuit (IC). The method can also include generating pulse signal responsive to an enable signal provided at at least one input terminal of the IC and providing a drive signal to the output terminal to cause a linearly increasing voltage across the capacitor responsive to the pulse signal. The method can also include measuring a no-load delay. The method can also include measuring the linearly increasing voltage at the output terminal responsive to the drive signal. The method can also include determining a first capacitance charge time for the capacitor responsive to the linearly increasing voltage reaching a threshold and determining a second capacitance charge delay for a second capacitance based on the first capacitance charge time and the no-load delay.

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