Plasma processing apparatus and plasma processing method

    公开(公告)号:US09875881B2

    公开(公告)日:2018-01-23

    申请号:US14183723

    申请日:2014-02-19

    Abstract: At a first timing after mounting a semiconductor wafer W on an electrostatic chuck 38, a susceptor 12 is switched from an electrically grounded state into a floated state. From a second timing after the first timing, a second high frequency power HF for plasma generation is applied to the susceptor 12, and a processing gas is excited into plasma in a chamber 10. From a third timing after the second timing, a first high frequency power LF for ion attraction is applied to the susceptor 12, and a self-bias (−Vdc) is generated. From a fourth timing close to the third timing, a negative second DC voltage −BDC corresponding to the self-bias (−Vdc) is applied to the susceptor 12. From the fifth timing after the fourth timing, a positive first DC voltage ADC is applied to an inner electrode 42 of the electrostatic chuck 38.

    PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
    2.
    发明申请
    PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD 有权
    等离子体加工设备和等离子体处理方法

    公开(公告)号:US20140231389A1

    公开(公告)日:2014-08-21

    申请号:US14183723

    申请日:2014-02-19

    Abstract: At a first timing after mounting a semiconductor wafer W on an electrostatic chuck 38, a susceptor 12 is switched from an electrically grounded state into a floated state. From a second timing after the first timing, a second high frequency power HF for plasma generation is applied to the susceptor 12, and a processing gas is excited into plasma in a chamber 10. From a third timing after the second timing, a first high frequency power LF for ion attraction is applied to the susceptor 12, and a self-bias (−Vdc) is generated. From a fourth timing close to the third timing, a negative second DC voltage −BDC corresponding to the self-bias (−Vdc) is applied to the susceptor 12. From the fifth timing after the fourth timing, a positive first DC voltage ADC is applied to an inner electrode 42 of the electrostatic chuck 38.

    Abstract translation: 在将半导体晶片W安装在静电卡盘38上的第一定时,基座12从电接地状态切换到浮动状态。 从第一定时之后的第二时刻开始,对基座12施加用于等离子体产生的第二高频功率HF,并将处理气体激发到室10内的等离子体。从第二定时以后的第三时刻开始,第一高 对基座12施加用于离子吸引的频率功率LF,产生自偏压(-Vdc)。 从靠近第三定时的第四定时,将与自偏压(-Vdc)相对应的负的第二直流电压-BDC施加到基座12.从第四定时之后的第五定时,正的第一直流电压ADC为 施加到静电卡盘38的内部电极42。

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