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公开(公告)号:US11073740B2
公开(公告)日:2021-07-27
申请号:US16637774
申请日:2018-07-30
Applicant: TOPCON CORPORATION , RIKEN
Inventor: Yoshikiyo Moriguchi , Hiroaki Minamide
Abstract: A terahertz-wave generation method of generating a terahertz wave in a direction satisfying a non-collinear phase-matching condition by making pump light incident on a nonlinear optical crystal capable of generating a terahertz wave by optical parametric effect, makes the pump light incident on the nonlinear optical crystal so that a peak excited power density is equal to or greater than a predetermined terahertz-wave lasing threshold and equal to or less than a predetermined laser damage threshold, and an average excited power density, is equal to or less than a predetermined photorefractive effect occurrence threshold, the pump light having a pulse width of 10 ps or more, the pulse width of 1 ns or less, and a repetition frequency of 1 kHz or more.
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公开(公告)号:US20230288327A1
公开(公告)日:2023-09-14
申请号:US18170865
申请日:2023-02-17
Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD. , RIKEN
Inventor: Syusaku Yamamoto , Keisuke Kajikawa , Yuichiro Kamino , Hiroaki Minamide , Koji Nawata
IPC: G01N21/3581 , H01S3/00 , G01N21/21 , G01N21/47
CPC classification number: G01N21/3581 , H01S3/0092 , G01N21/21 , G01N21/47 , G01N2021/216 , G01N2021/4709 , G01N2021/4792 , G02F1/3551
Abstract: An inspection device includes: a light source for outputting pulsed excitation light with a time width of 10 picoseconds to 10 nanoseconds; a nonlinear optical crystal for generating a terahertz wave by optical wavelength conversion of the pulsed excitation light; a polarization part for reflecting at least a part of a reflected wave of the terahertz wave reflected by an inspection target; and a detector for detecting the reflected wave reflected by the polarization part.
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公开(公告)号:US10725359B2
公开(公告)日:2020-07-28
申请号:US16338134
申请日:2017-09-26
Applicant: RIKEN
Inventor: Kouji Nawata , Yu Tokizane , Hiroaki Minamide
Abstract: In order to accomplish highly-efficient nonlinear optical wavelength conversion for terahertz waves by using a simple configuration, an embodiment of the present invention provides a terahertz wave generating device 100 provided with a pump light source 104 that generates pump light LP of a single wavelength and a nonlinear optical element (periodical polarization inversion element) 102. The nonlinear optical element has a periodic structure in which the polarization or the crystal orientation is periodically inverted with a certain inversion period Λ. When the pump light enters the nonlinear optical element, idler light LI and signal light LTHz are generated. The idler light and the signal light satisfy the law of conservation of energy for the pump light and a collinear phase matching condition for a virtual pump light wave vector k′p obtained by vector addition or subtraction of a grating vector kΛ which corresponds to the inversion period, to or from a pump light wave vector kp in the nonlinear optical element. The embodiment of the present invention also provides an optical parametric amplifier, a terahertz wave detector, and a nonlinear optical element.
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公开(公告)号:US10345224B2
公开(公告)日:2019-07-09
申请号:US15517925
申请日:2015-10-05
Applicant: RIKEN
Inventor: Kouji Nawata , Hiroaki Minamide , Shuzhen Fan , Feng Qi , Hiromasa Ito
IPC: G01N21/17 , G01N21/3581 , G02F1/37 , G02F1/365 , G02F1/35
Abstract: An optical response measuring device is provided with a light source, first and second wavelength conversion elements and a light intensity sensor array. The light source generates a pair of light beams including light beams of first and second wavelengths, and the first wavelength conversion element generates measurement light. The measurement light is irradiated on an object for measurement and a detection light having first phase and second phase is obtained in response to this irradiation. A reference light that carries the phase of the pair of the pair light beams and the detection light both pass through a second wavelength conversion element to obtain a modulated reference light have first and second intensities. The first and second local intensities are then measured by the light intensity sensor array.
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公开(公告)号:US12287286B2
公开(公告)日:2025-04-29
申请号:US18170865
申请日:2023-02-17
Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD. , RIKEN
Inventor: Syusaku Yamamoto , Keisuke Kajikawa , Yuichiro Kamino , Hiroaki Minamide , Koji Nawata
IPC: G01N21/21 , G01N21/3581 , G01N21/47
Abstract: An inspection device includes: a light source for outputting pulsed excitation light with a time width of 10 picoseconds to 10 nanoseconds; a nonlinear optical crystal for generating a terahertz wave by optical wavelength conversion of the pulsed excitation light; a polarization part for reflecting at least a part of a reflected wave of the terahertz wave reflected by an inspection target; and a detector for detecting the reflected wave reflected by the polarization part.
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公开(公告)号:US20230288326A1
公开(公告)日:2023-09-14
申请号:US18170855
申请日:2023-02-17
Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD. , RIKEN
Inventor: Syusaku Yamamoto , Keisuke Kajikawa , Yuichiro Kamino , Hiroaki Minamide , Koji Nawata
IPC: G01N21/3581 , G02F1/355 , G02F1/35
CPC classification number: G01N21/3581 , G02F1/3551 , G02F1/3503 , G02F1/3505
Abstract: An inspection device includes: a light source for outputting pulsed excitation light with a time width of 10 picoseconds to 10 nanoseconds; a nonlinear optical crystal for generating a terahertz wave by optical wavelength conversion of the excitation light; and a detector for detecting a reflected wave of the terahertz wave reflected by an inspection target.
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公开(公告)号:US09040918B2
公开(公告)日:2015-05-26
申请号:US14249046
申请日:2014-04-09
Applicant: RIKEN
Inventor: Kouji Nawata , Hiroaki Minamide , Hiromasa Ito , Shin'ichiro Hayashi
CPC classification number: G01J1/0425 , G01J1/42 , G01J3/0205 , G01J3/18 , G01J3/42 , G01N21/3581 , G02F1/3558 , G02F1/365 , G02F2001/3548 , G02F2203/13
Abstract: The present invention includes a slanted periodically poled device 12 including a light input surface 12a and a light output surface 12b parallel to each other and a terahertz wave input surface 12c orthogonal to the light input surface 12a and the light output surface 12b, a pump beam source 14 which emits pump beam 1 perpendicularly to the light input surface 12a, and a photodetector 16 which detects an up-conversion signal beam A converted from a terahertz wave 3 emitted perpendicularly from the light output surface 12b. The slanted periodically poled device 12 is configured to generate the up-conversion signal beam A in the same direction as and in parallel with the pump beam 1 by quasi phase matching between the terahertz wave 3 perpendicularly incident from the terahertz wave input surface 12c and the pump beam 1.
Abstract translation: 本发明包括一个倾斜的周期极化装置12,它包括彼此平行的光输入表面12a和光输出表面12b以及与光输入表面12a和光输出表面12b正交的太赫波输入表面12c, 源极14,其垂直于光输入表面12a发射泵浦光束1;以及光电检测器16,其检测从从光输出表面12b垂直发射的太赫兹波3转换的上转换信号光束A. 倾斜的周期性极化装置12被配置为通过从太赫兹波输入表面12c垂直入射的太赫兹波3和从太赫兹波输入表面12c的太赫兹波3之间的准相位匹配,在与泵浦光束1相同的方向上产生上变换信号光束A, 泵梁1。
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