摘要:
A vehicle exterior component includes a cover, a housing, a flat substrate, a light emitter, and a lens. The cover and the housing are located frontward from a radar device in an electromagnetic wave transmission direction of the radar device. The radar device is installed in a vehicle. The flat substrate is arranged inside the housing. The light emitter is arranged on the substrate. The lens is arranged inside the housing. The housing extends over a surface of the cover facing the radar device. The light emitter emits light that illuminates an ornamental portion of the cover. The substrate is located outside an electromagnetic wave transmission range of the radar device. The lens reflects the light from the light emitter toward the ornamental portion.
摘要:
A vehicle exterior component includes a cover, a housing, and a substrate. The cover is configured to arranged forward of a radar device in an emission direction of electromagnetic waves. The housing covers a rear surface of the cover. The substrate is arranged in the housing. The substrate includes a light emitting unit configured to emit visible light. The cover forms an angle in a range of 0° to 5° with respect to an orthogonal plane that is orthogonal to the emission direction. The rear wall of the housing faces the cover in the emission direction and forms an angle in a range of 2° to 10° with respect to the orthogonal plane.
摘要:
The present invention provides a Group III nitride semiconductor light-emitting device which is intended to relax stress applied to a light-emitting layer. The light-emitting device includes an MQW layer, and an n-side superlattice layer formed below the MQW layer. The n-side superlattice layer is formed by repeatedly depositing layer units, each unit including an InGaN layer, a GaN layer, and an n-GaN layer which are sequentially deposited from the side of the sapphire substrate. In the n-side superlattice layer, an InGaN layer more proximal to the MQW layer has a higher In compositional proportion. The In compositional proportion of the InGaN layer (which is most proximal to the MQW layer) of the n-side superlattice layer is 70% to 100% of the In compositional proportion of the InGaN layer (which is most proximal to the n-side superlattice layer) of the MQW layer.