Semiconductor detector
    1.
    发明授权

    公开(公告)号:US09766354B2

    公开(公告)日:2017-09-19

    申请号:US14152332

    申请日:2014-01-10

    IPC分类号: G01T3/08 G01T1/36 G01T1/24

    CPC分类号: G01T1/366 G01T1/241 G01T3/08

    摘要: The invention provides a semiconductor detector, and the semiconductor detector comprises a semiconductor crystal, a cathode, an anode and at least one ladder electrode; the semiconductor crystal comprises a top surface, a bottom surface and at least one side; the cathode, the anode and the ladder electrode are conductive thin films deposited on a surface of the semiconductor crystal; the cathode is disposed on the bottom surface of the semiconductor crystal, the anode is disposed on the top surface of the semiconductor crystal, the ladder electrode is disposed on the at least one side of the semiconductor crystal; and the ladder electrode comprises a plurality of sub-electrodes. As compared to the prior art, the semiconductor detector can improve the energy resolution.

    Gantry configuration for combined mobile radiation inspection system
    3.
    发明授权
    Gantry configuration for combined mobile radiation inspection system 有权
    组合式移动辐射检测系统的龙门架配置

    公开(公告)号:US09453935B2

    公开(公告)日:2016-09-27

    申请号:US14412512

    申请日:2013-07-02

    IPC分类号: G01V5/00 G01N23/04 F16M11/42

    摘要: The present invention discloses a gantry configuration for a combined mobile radiation inspection system comprising a first arm frame, a second arm frame and a third arm frame. The first, second and third arm frames define a scanning channel to allow an inspected object to pass therethrough. The gantry configuration for the combined mobile radiation inspection system further comprises a position sensing device configured to detect a position error between the first arm frame and the second arm frame; and a controller configured to control a moving speed of at least one of the first arm frame and the second arm frame based on the detected position error, so that the position error between the first arm frame and the second arm frame is equal to zero. Compared with the prior art, the present invention is advantageous at least in that an automatic deviation correction device is provided on the gantry arm frame, and thus the position error between both side arm frames can be automatically controlled to zero, so that the gantry arm frame can be effectively prevented from being subjected to a force and deforming, and the radiation detector can receive the full ray, thereby improving the imaging quality.

    摘要翻译: 本发明公开了一种用于组合的移动辐射检查系统的机架结构,其包括第一臂架,第二臂架和第三臂架。 第一,第二和第三臂架限定扫描通道以允许被检查物体通过。 组合移动辐射检查系统的台架结构还包括一个位置检测装置,其配置成检测第一臂架和第二臂架之间的位置误差; 以及控制器,其被配置为基于所检测的位置误差来控制所述第一臂框架和所述第二臂架中的至少一个的移动速度,使得所述第一臂框架和所述第二臂架之间的位置误差等于零。 与现有技术相比,本发明至少是在台架臂架上设置自动偏差校正装置是有利的,因此两侧臂架之间的位置误差可被自动控制为零,使得机架臂 可以有效地防止框架受到力和变形,并且放射线检测器可以接收全光线,从而提高成像质量。

    GANTRY CONFIGURATION FOR COMBINED MOBILE RADIATION ISPECTION SYSTEM
    4.
    发明申请
    GANTRY CONFIGURATION FOR COMBINED MOBILE RADIATION ISPECTION SYSTEM 有权
    用于组合的移动辐射系统的GANTRY配置

    公开(公告)号:US20150192689A1

    公开(公告)日:2015-07-09

    申请号:US14412512

    申请日:2013-07-02

    IPC分类号: G01V5/00 F16M11/42

    摘要: The present invention discloses a gantry configuration for a combined mobile radiation inspection system comprising a first arm frame, a second arm frame and a third arm frame. The first, second and third arm frames define a scanning channel to allow an inspected object to pass therethrough. The gantry configuration for the combined mobile radiation inspection system further comprises a position sensing device configured to detect a position error between the first arm frame and the second arm frame; and a controller configured to control a moving speed of at least one of the first arm frame and the second arm frame based on the detected position error, so that the position error between the first arm frame and the second arm frame is equal to zero. Compared with the prior art, the present invention is advantageous at least in that an automatic deviation correction device is provided on the gantry arm frame, and thus the position error between both side arm frames can be automatically controlled to zero, so that the gantry arm frame can be effectively prevented from being subjected to a force and deforming, and the radiation detector can receive the full ray, thereby improving the imaging quality.

    摘要翻译: 本发明公开了一种用于组合的移动辐射检测系统的机架结构,其包括第一臂架,第二臂架和第三臂架。 第一,第二和第三臂架限定扫描通道以允许被检查物体通过。 组合移动辐射检查系统的台架结构还包括一个位置检测装置,其配置成检测第一臂架和第二臂架之间的位置误差; 以及控制器,其被配置为基于所检测的位置误差来控制所述第一臂框架和所述第二臂架中的至少一个的移动速度,使得所述第一臂框架和所述第二臂架之间的位置误差等于零。 与现有技术相比,本发明至少是在台架臂架上设置自动偏差校正装置是有利的,因此两侧臂架之间的位置误差可被自动控制为零,使得机架臂 可以有效地防止框架受到力和变形,并且放射线检测器可以接收全光线,从而提高成像质量。

    SEMICONDUCTOR DETECTOR
    5.
    发明申请
    SEMICONDUCTOR DETECTOR 有权
    半导体检测器

    公开(公告)号:US20140319635A1

    公开(公告)日:2014-10-30

    申请号:US14152332

    申请日:2014-01-10

    IPC分类号: G01T1/36 G01T3/08

    CPC分类号: G01T1/366 G01T1/241 G01T3/08

    摘要: The invention provides a semiconductor detector, and the semiconductor detector comprises a semiconductor crystal, a cathode, an anode and at least one ladder electrode; the semiconductor crystal comprises a top surface, a bottom surface and at least one side; the cathode, the anode and the ladder electrode are conductive thin films deposited on a surface of the semiconductor crystal; the cathode is disposed on the bottom surface of the semiconductor crystal, the anode is disposed on the top surface of the semiconductor crystal, the ladder electrode is disposed on the at least one side of the semiconductor crystal; and the ladder electrode comprises a plurality of sub-electrodes. As compared to the prior art, the semiconductor detector can improve the energy resolution.

    摘要翻译: 本发明提供一种半导体检测器,该半导体检测器包括半导体晶体,阴极,阳极和至少一个梯形电极; 半导体晶体包括顶表面,底表面和至少一个侧面; 阴极,阳极和梯形电极是沉积在半导体晶体表面上的导电薄膜; 阴极设置在半导体晶体的底表面上,阳极设置在半导体晶体的顶表面上,梯形电极设置在半导体晶体的至少一个侧面上; 并且梯形电极包括多个子电极。 与现有技术相比,半导体检测器可以提高能量分辨率。