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公开(公告)号:US20180314145A1
公开(公告)日:2018-11-01
申请号:US15883234
申请日:2018-01-30
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Lin Louis CHANG , Jen-Hao YEH , Tzung-Chi FU , Bo-Tsun LIU , Li-Jui CHEN , Po-Chung CHENG
IPC: G03F1/24 , G03F7/20 , H01L21/027
CPC classification number: G03F1/24 , G03F7/70025 , G03F7/70033 , H01L21/0275 , H05G2/00
Abstract: A method and system for generating EUV light includes providing a laser beam having a Gaussian distribution. This laser beam can be then modified from a Gaussian distribution to a ring-like distribution. The modified laser beam is provided through an aperture in a collector and interfaces with a moving droplet target, which generates an extreme ultraviolet (EUV) wavelength light. The generated EUV wavelength light is provided to the collector away from the aperture. In some embodiments, a mask element may also be used to modify the laser beam to a shape.
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公开(公告)号:US20220386440A1
公开(公告)日:2022-12-01
申请号:US17818210
申请日:2022-08-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Lin Louis CHANG , Jen-Hao YEH , Tzung-Chi FU , Bo-Tsun LIU , Lin-Jui CHEN , Po-Chung CHENG
Abstract: A method for generating EUV light includes providing a laser beam having a Gaussian distribution. This laser beam can be then modified from a Gaussian distribution to a ring-like distribution. The modified laser beam is provided through an aperture in a collector and interfaces with a moving droplet target, which generates an extreme ultraviolet (EUV) wavelength light. The generated EUV wavelength light is provided to the collector away from the aperture. In some embodiments, a mask element may also be used to modify the laser beam to a shape.
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公开(公告)号:US20210168923A1
公开(公告)日:2021-06-03
申请号:US17248785
申请日:2021-02-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Lin Louis CHANG , Jen-Hao YEH , Tzung-Chi FU , Bo-Tsun LIU , Li-Jui CHEN , Po-Chung CHENG
Abstract: A method and system for generating EUV light includes providing a laser beam having a Gaussian distribution. This laser beam can be then modified from a Gaussian distribution to a ring-like distribution. The modified laser beam is provided through an aperture in a collector and interfaces with a moving droplet target, which generates an extreme ultraviolet (EUV) wavelength light. The generated EUV wavelength light is provided to the collector away from the aperture. In some embodiments, a mask element may also be used to modify the laser beam to a shape.
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公开(公告)号:US20200026179A1
公开(公告)日:2020-01-23
申请号:US16587018
申请日:2019-09-29
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Lin Louis CHANG , Jen-Hao YEH , Tzung-Chi FU , Bo-Tsun LIU , Li-Jui CHEN , Po-Chung CHENG
IPC: G03F1/24 , H01L21/027 , G03F7/20 , H05G2/00
Abstract: A method and system for generating EUV light includes providing a laser beam having a Gaussian distribution. This laser beam can be then modified from a Gaussian distribution to a ring-like distribution. The modified laser beam is provided through an aperture in a collector and interfaces with a moving droplet target, which generates an extreme ultraviolet (EUV) wavelength light. The generated EUV wavelength light is provided to the collector away from the aperture. In some embodiments, a mask element may also be used to modify the laser beam to a shape.
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公开(公告)号:US20200033194A1
公开(公告)日:2020-01-30
申请号:US16438710
申请日:2019-06-12
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Jen-Hao YEH , Chun-Lin CHANG , Han-Lung CHANG , Li-Jui CHEN , Po-Chung CHENG
Abstract: A light source system is provided. The light source system is capable of measuring a polarization angle and includes a light source configured to emit an original light beam, and the original light beam has an original polarization angle. The light source system further includes an amplifying module configured to amplify the original light beam and generate a forward beam for hitting a target, and the forward beam has a forward polarization angle that is equal to the original polarization angle. The light source system further includes a polarization measurement unit, and the polarization measurement unit includes a first polarization measurement module configured to receive a first return beam and measure a first polarization angle of the first return beam. The first return beam is reflected from the target.
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