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公开(公告)号:US06576381B1
公开(公告)日:2003-06-10
申请号:US09913156
申请日:2001-08-10
IPC分类号: G03C300
CPC分类号: H01L24/12 , C08G73/22 , C09D179/04 , G03F7/0233 , H01L23/5329 , H01L24/11 , H01L24/13 , H01L2224/0231 , H01L2224/0401 , H01L2224/05124 , H01L2224/05147 , H01L2224/05166 , H01L2224/05171 , H01L2224/11 , H01L2224/1147 , H01L2224/13 , H01L2224/13099 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01011 , H01L2924/01013 , H01L2924/01019 , H01L2924/01022 , H01L2924/01023 , H01L2924/01024 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01039 , H01L2924/01078 , H01L2924/01082 , H01L2924/014 , H01L2924/10253 , H01L2924/15787 , H01L2924/19042 , H01L2924/00 , H01L2924/00014
摘要: The present invention alleviates the operational problems in production of flip chips and provides a semiconductor device superior in various reliabilities. The preset invention lies in an encapsulated semiconductor device comprising: (a) a polybenzoxazole resin film for chip protection, obtained by coating, on a circuit-formed chip, a positive photosensitive resin composition comprising 100 parts by weight of a polyamide and 1 to 100 parts by weight of a photosensitive diazoquinone compound, and subjecting the coated composition to patterning and curing, and (b) a bump electrode.
摘要翻译: 本发明减轻了倒装芯片生产中的操作问题,并且提供了在各种可靠性方面优异的半导体器件。 本发明的目的在于一种封装半导体装置,其特征在于,包括:(a)通过在电路形成的芯片上涂布由100重量份聚酰胺和1〜100重量份的正型感光性树脂组合物而得到的用于芯片保护的聚苯并恶唑树脂膜 重量份的光敏重氮醌化合物,并对涂覆的组合物进行图案化和固化,和(b)凸块电极。