Electrooptic apparatus substrate and examining method therefor and electrooptic apparatus and electronic equipment
    1.
    发明授权
    Electrooptic apparatus substrate and examining method therefor and electrooptic apparatus and electronic equipment 有权
    电光设备基板及其检测方法及电光设备及电子设备

    公开(公告)号:US07839372B2

    公开(公告)日:2010-11-23

    申请号:US11572443

    申请日:2005-08-08

    IPC分类号: G09G3/36

    摘要: An electrooptic apparatus substrate and examination method therefor can be provided which can implement an examination without requiring bringing a probe into contact thereto from the outside and with satisfactory measuring accuracy. A substrate 1 of the present invention includes a video line 7 and transmission date portion 6 through multiple switching elements for writing a first potential signal in multiple pixels through a signal line. The substrate 1 further includes a display data reading circuit portion 4 having a differential amplifier 4a for lowering a lower potential and heightening a higher potential and outputting it to the signal line and a transmission gate portion 6 and video line 7 for reading the first potential signal and a reference second potential signal.

    摘要翻译: 可以提供电光装置基板及其检查方法,其可以实现检查,而不需要使外部探头与其接触并且具有令人满意的测量精度。 本发明的基板1通过多个开关元件包括视频线7和发送日期部分6,用于通过信号线写入多个像素中的第一电位信号。 基板1还包括显示数据读取电路部分4,其具有用于降低较低电势并提高较高电位并将其输出到信号线的差分放大器4a以及用于读取第一电位信号的传输门极部分6和视频线路7 和参考第二电位信号。

    ELECTROOPTIC APPARATUS SUBSTRATE AND EXAMINING METHOD THEREFOR AND ELECTROOPTIC APPARATUS AND ELECTRONIC EQUIPMENT
    2.
    发明申请
    ELECTROOPTIC APPARATUS SUBSTRATE AND EXAMINING METHOD THEREFOR AND ELECTROOPTIC APPARATUS AND ELECTRONIC EQUIPMENT 有权
    电子设备基板及其检测方法及电子设备及电子设备

    公开(公告)号:US20090267873A1

    公开(公告)日:2009-10-29

    申请号:US11572443

    申请日:2005-08-08

    IPC分类号: G09G3/30 G01R31/02

    摘要: An electrooptic apparatus substrate and examination method therefor can be provided which can implement an examination without requiring bringing a probe into contact thereto from the outside and with satisfactory measuring accuracy. A substrate 1 of the present invention includes a video line 7 and transmission gate portion 6 through multiple switching elements for writing a first potential signal in multiple pixels through a signal line. The substrate 1 further includes a display data reading circuit portion 4 having a differential amplifier 4a for lowering a lower potential and heightening a higher potential and outputting it to the signal line and a transmission gate port on 6 and video line 7 for reading the first potential signal and a reference second potential signal.

    摘要翻译: 可以提供电光装置基板及其检查方法,其可以实现检查,而不需要使外部探头与其接触并且具有令人满意的测量精度。 本发明的基板1通过多个开关元件包括视频线7和传输门极部分6,用于通过信号线写入多个像素中的第一电位信号。 基板1还包括显示数据读取电路部分4,其具有用于降低较低电势并提高较高电位并将其输出到信号线的差分放大器4a和6上的传输门口以及用于读取第一电位的视频线7 信号和参考第二电位信号。

    Edge position detecting apparatus and image forming apparatus

    公开(公告)号:US11577924B2

    公开(公告)日:2023-02-14

    申请号:US17104469

    申请日:2020-11-25

    摘要: An edge position detecting apparatus includes a light emitting device, a detecting device, and a calculating circuit. The light emitting device includes a plurality of light sources with different emission wavelengths. The light emitting device irradiates a conveyed object with linear light along a width direction of the conveyed object, the width direction being perpendicular to a conveying direction of the conveyed object. The detecting device detects, at a plurality of positions in the width direction of the conveyed object, intensity of reflected light of light emitted by the light emitting device. The calculating circuit calculates, based on a detection result of the detecting device, a position of an edge of the conveyed object in the width direction.