Abstract:
The invention provides an electrostatic discharge (ESD) protection device having an ESD path between a first circuit and a second circuit. The electrostatic discharge protection device includes a first doped region having a first conductive type. A first well has a second conductive type opposite to the first conductive type. A second doped region and a third doped region are in the first well, respectively having the first and second conductive types. The first doped region is coupled to a power supply terminal or a ground terminal of the first circuit, and the second and third doped regions are both coupled to a power supply terminal or a ground terminal of the second circuit, respectively.
Abstract:
A non-volatile memory array structure includes N bit lines, M first word lines, M×N first memory cells, a second word line, n repair circuits and a sense amplifier. The N bit lines and M first word lines are interlaced to control the M×N first memory cell. The second word line is placed across the n bit lines. Each of the repair circuits is electrically connected between the corresponding bit line and the sense amplifier. M and N are natural number.
Abstract:
An electrostatic discharge (ESD) protection device for providing an ESD path between two circuitries is provided. Each circuitry has a power supply terminal and a ground terminal. The protection device comprises an equivalent MOS, a first terminal, and a second terminal. The equivalent MOS comprises a source, a drain and a gate, wherein the drain is connected to the gate. The first terminal is connected to the gate, while the second terminal is connected to the source. The first terminal is connected to one power supply terminal and ground terminal, whereas the second terminal is connected to the other the power supply terminal and ground terminal.
Abstract:
A resistance compensation circuit and a method thereof for tuning frequency, includes several resistors serially connected to one another, several transistors, each of which connects across one of the corresponding resistances, and a register electrically connected to the gates of the transistors. A control signal controls the switching of the transistors either to compensate the process variation of the resistance through the register or to tune the working frequency of the Integrated circuit.
Abstract:
A display control device for a flat panel display is provided and includes a display controller and a timing controller. The display controller is provided for receiving an input signal and generating a display signal and a plurality of timing signals corresponding to the display signal. The timing controller includes a timing control unit and a data processing unit. The timing control unit is coupled to the display controller for providing a plurality of control signals required for the flat panel display. The data processing unit is incorporated into the display controller in a first integrated circuit chip for receiving the display signal and generating a plurality of output signals in synchronization with the timing signals. The output signals are output to the flat panel display through a predetermined interface.
Abstract:
An electrostatic discharge (ESD) protection device for providing an ESD path between two circuitries is provided. Each circuitry has a power supply terminal and a ground terminal. The protection device comprises an equivalent MOS, a first terminal, and a second terminal. The equivalent MOS comprises a source, a drain and a gate, wherein the drain is connected to the gate. The first terminal is connected to the gate, while the second terminal is connected to the source. The first terminal is connected to one power supply terminal and ground terminal, whereas the second terminal is connected to the other the power supply terminal and ground terminal.
Abstract:
An I/O regulating circuitry is provided. The I/O regulating circuitry omits the ESD device in a CMOS process with a minimized critical dimension to reduce chip size while still maintaining electrostatic discharge immunity. The I/O regulating circuitry is applied in MLC flash memory applications and the flash controller thereof.
Abstract translation:提供了一个I / O调节电路。 I / O调节电路在CMOS工艺中省略了ESD器件,具有最小化的临界尺寸,以减少芯片尺寸,同时仍然保持静电放电抗扰性。 I / O调节电路应用于MLC闪存应用及其闪存控制器。
Abstract:
A non-volatile memory array structure includes N bit lines, M first word lines, M×N first memory cells, a second word line, n repair circuits and a sense amplifier. The N bit lines and M first word lines are interlaced to control the M×N first memory cell. The second word line is placed across the n bit lines. Each of the repair circuits is electrically connected between the corresponding bit line and the sense amplifier. M and N are natural number.
Abstract:
An electrostatic discharge circuit includes at least an electrostatic discharge zener diode, an NMOS transistor, and a PMOS transistor. The electrostatic discharge zener diode is used for lowering the breakdown voltage and making the electrical current discharge through it, thereby preventing the circuit device from burning out and greatly enhancing the function of electrostatic discharge protection.
Abstract:
Three diode structures on a metal-oxide-semiconductor (MOS) wafer. Each diode structure is capable of reducing parasitic current through the wafer and hence increasing the power conversion efficiency of a voltage step-up circuit.