公开(公告)号：US20220018896A1

公开(公告)日：2022-01-20

申请号：US17379940

申请日：2021-07-19

Applicant: Tektronix, Inc.

Inventor： Charles W. Case ,  Daniel G. Knierim ,  Joshua J. O'Brien ,  Josiah A. Bartlett ,  Julie A. Campbell

IPC: G01R31/28 ,  G01R29/26

Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.

公开(公告)号：US20240069094A1

公开(公告)日：2024-02-29

申请号：US18387810

申请日：2023-11-07

Applicant: Tektronix, Inc.

Inventor： Charles W. Case ,  Daniel G. Knierim ,  Joshua J. O'Brien ,  Josiah A. Bartlett ,  Julie A. Campbell

IPC: G01R31/28 ,  G01R29/26

CPC classification number: G01R31/2886 ,  G01R29/26

Abstract: A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.

公开(公告)号：US11815548B2

公开(公告)日：2023-11-14

申请号：US17379940

申请日：2021-07-19

Applicant: Tektronix, Inc.

Inventor： Charles W. Case ,  Daniel G. Knierim ,  Joshua J. O'Brien ,  Josiah A. Bartlett ,  Julie A. Campbell

IPC: G01R31/28 ,  G01R29/26

CPC classification number: G01R31/2886 ,  G01R29/26

Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.