公开(公告)号：US11237204B2

公开(公告)日：2022-02-01

申请号：US16538564

申请日：2019-08-12

Applicant: Tektronix, Inc.

Inventor： Gregory A. Martin ,  Patrick Satarzadeh ,  Karen Hovakimyan ,  Hungming Chang

IPC: G01R31/28 ,  G01R31/3167 ,  G01R31/317 ,  G01R31/319

Abstract: A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.

公开(公告)号：US20200209307A1

公开(公告)日：2020-07-02

申请号：US16538564

申请日：2019-08-12

Applicant: Tektronix, Inc.

Inventor： Gregory A. Martin ,  Patrick Satarzadeh ,  Karen Hovakimyan ,  Hungming Chang

IPC: G01R31/28 ,  G01R31/3167 ,  G01R31/319 ,  G01R31/317

Abstract: A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.