公开(公告)号：US20230251699A1

公开(公告)日：2023-08-10

申请号：US18105736

申请日：2023-02-03

申请人： Tektronix, Inc.

发明人： Madhusudan Acharya ,  Yogesh M. Pai ,  Krishna N H Sri ,  Anthony B. Ambrose ,  Blair Battye ,  Dallas J. Mohler

IPC分类号： G06F1/30 ,  G06F1/28

CPC分类号： G06F1/305 ,  G06F1/28

摘要： A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.

公开(公告)号：US20240142530A1

公开(公告)日：2024-05-02

申请号：US18385318

申请日：2023-10-30

申请人： Tektronix, Inc.

发明人： K T Anurag ,  Krishna N H Sri ,  Madhusudan Acharya ,  P E Ramesh

IPC分类号： G01R31/389 ,  G01R31/367 ,  G01R31/3842

CPC分类号： G01R31/389 ,  G01R31/367 ,  G01R31/3842

摘要： A testing system for performing Electrochemical Impedance Spectroscopy on a Unit Under Test (UUT) includes a function generator configured to apply a plurality of frequency components combined in a single burst or broadband stimulus to the UUT, and an oscilloscope having one or more processors configured to measure an amplitude ratio and phase difference between a voltage and a current of the UUT at a plurality of frequencies after the single burst or broadband stimulus of frequency components has been applied, generate a Nyquist plot of impendence values in both real and imaginary axes from the measured phase difference, and present the Nyquist plot at an output of the oscilloscope. Methods of operation are also described.