公开(公告)号：US12092693B2

公开(公告)日：2024-09-17

申请号：US17849577

申请日：2022-06-24

Applicant: Tektronix, Inc.

Inventor： Parjanya Adiga ,  Niranjan R. Hegde ,  Krishna N H. Sri ,  Gary J. Waldo ,  Yogesh M. Pai

IPC: G01R31/34 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08

CPC classification number: G01R31/343 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08 ,  H02P2207/05

Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.

公开(公告)号：US20220413051A1

公开(公告)日：2022-12-29

申请号：US17849577

申请日：2022-06-24

Applicant: Tektronix, Inc.

Inventor： Parjanya Adiga ,  Niranjan R. Hegde ,  Krishna N H. Sri ,  Gary J. Waldo ,  Yogesh M. Pai

IPC: G01R31/34 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08

Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.