公开(公告)号：US20240044968A1

公开(公告)日：2024-02-08

申请号：US18361672

申请日：2023-07-28

申请人： Tektronix, Inc.

发明人： Vivek Shivaram ,  Niranjan R. Hegde ,  Krishna N H Sri ,  Abhishek Naik ,  Shubha B ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC分类号： G01R31/26 ,  G01R31/28 ,  G01R1/067

CPC分类号： G01R31/2603 ,  G01R31/2889 ,  G01R1/06788

摘要： A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.

公开(公告)号：US20240353470A1

公开(公告)日：2024-10-24

申请号：US18641314

申请日：2024-04-19

申请人： Tektronix, Inc.

发明人： Niranjan R. Hegde ,  Daniel G. Knierim ,  Vivek Shivaram ,  Krishna N H Sri ,  Joshua J. O'Brien ,  Shubha B ,  Yogesh M. Pai

IPC分类号： G01R31/26

CPC分类号： G01R31/2621

摘要： A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.

公开(公告)号：US12092693B2

公开(公告)日：2024-09-17

申请号：US17849577

申请日：2022-06-24

申请人： Tektronix, Inc.

发明人： Parjanya Adiga ,  Niranjan R. Hegde ,  Krishna N H. Sri ,  Gary J. Waldo ,  Yogesh M. Pai

IPC分类号： G01R31/34 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08

CPC分类号： G01R31/343 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08 ,  H02P2207/05

摘要： A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.

公开(公告)号：US20220413051A1

公开(公告)日：2022-12-29

申请号：US17849577

申请日：2022-06-24

申请人： Tektronix, Inc.

发明人： Parjanya Adiga ,  Niranjan R. Hegde ,  Krishna N H. Sri ,  Gary J. Waldo ,  Yogesh M. Pai

IPC分类号： G01R31/34 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08

摘要： A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.