公开(公告)号：US20240159797A1

公开(公告)日：2024-05-16

申请号：US18511977

申请日：2023-11-16

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Shane A. Hazzard ,  Scott T. Harrison ,  Timothy E. Bieber

IPC: G01R1/20

CPC classification number: G01R1/20 ,  G02B6/12

Abstract: A test and measurement system includes one or more remote heads, each of the one or more remote heads configured to be coupled to a respective device under test (DUT) to receive an electrical test signal from the DUT and each of the one or more remote heads including an electrical-to-optical (EOM) configured to convert the received electrical test signal into an optical test signal. Optical interconnection circuitry receives the optical test signal from the EOM of the one or more remote heads and, in response to control signals, selects one of the optical test signals to be provided to a test and measurement system. The optical interconnection circuitry further converts the selected optical test signal into an electrical test signal to be supplied to a test port of the test and measurement instrument. Methods are also described.