公开(公告)号：US20240159797A1

公开(公告)日：2024-05-16

申请号：US18511977

申请日：2023-11-16

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Shane A. Hazzard ,  Scott T. Harrison ,  Timothy E. Bieber

IPC: G01R1/20

CPC classification number: G01R1/20 ,  G02B6/12

Abstract: A test and measurement system includes one or more remote heads, each of the one or more remote heads configured to be coupled to a respective device under test (DUT) to receive an electrical test signal from the DUT and each of the one or more remote heads including an electrical-to-optical (EOM) configured to convert the received electrical test signal into an optical test signal. Optical interconnection circuitry receives the optical test signal from the EOM of the one or more remote heads and, in response to control signals, selects one of the optical test signals to be provided to a test and measurement system. The optical interconnection circuitry further converts the selected optical test signal into an electrical test signal to be supplied to a test port of the test and measurement instrument. Methods are also described.

公开(公告)号：US20220390513A1

公开(公告)日：2022-12-08

申请号：US17832535

申请日：2022-06-03

Applicant: Tektronix, Inc.

Inventor： Shane A. Hazzard ,  Ajaiey Kumar Sharma ,  Timothy E. Bieber ,  John Marrinan ,  Andrew McCann ,  Pieter Christiaan Seidel ,  Josiah A. Bartlett

IPC: G01R31/317

Abstract: An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument. In alternative architectures, two or more amplifiers are coupled to the plurality of test signals, and the multiplexer selects an output of one of the two amplifiers to pass to a measurement instrument for testing.

公开(公告)号：US20220407523A1

公开(公告)日：2022-12-22

申请号：US17845896

申请日：2022-06-21

Applicant: Tektronix, Inc.

Inventor： Joshua J. O'Brien ,  Timothy E. Bieber ,  Barton T. Hickman

IPC: H03L7/07 ,  H03L7/14

Abstract: A test and measurement instrument includes a first data channel including a first data converter operating at a first rate, and a second data channel including a second data converter operating at a second rate that is different than the first rate. Rate controls may include a clock generation circuit. The clock generation circuit includes an intermediate frequency generator structured to generate an intermediate frequency clock from a first clock reference signal, a first frequency clock generator structured to generate a first frequency clock directly from the intermediate frequency clock, and a second frequency clock generator structured to generate a second frequency clock directly from the intermediate frequency clock. The first frequency clock may be used to control the rate of the first data channel, and the second frequency clock may be used to control the rate of the second data channel. Methods are also described.