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公开(公告)号:US20240242978A1
公开(公告)日:2024-07-18
申请号:US18413295
申请日:2024-01-16
Applicant: Tokyo Electron Limited
Inventor: Shota UMEZAKI , Shigeru MORIYAMA , Tomotaka OMAGARI , Keiichi YAHATA , Shuji OIE , Yuichi TANAKA , Katsuhiro OOKAWA , Manabu YAMANAKA , Takuya ITAHASHI
CPC classification number: H01L21/67034 , F26B5/04 , H01L21/67126 , H01L21/67242
Abstract: A substrate processing apparatus includes a drying unit for replacing a liquid film formed on a substrate with a supercritical fluid to dry the substrate, and a control device. The drying unit includes a pressure container, a supply mechanism for supplying fluid to the pressure container, a discharge mechanism for discharging the fluid from the pressure container, a panel for separating an internal space from an external space, an electromagnetic lock, and a concentration sensor for detecting a concentration of the fluid. An unlocking condition for the control device to switch a state of the electromagnetic lock from a locked state to an unlocked state includes a condition that a detection value of the pressure sensor is less than or equal to a first threshold value and a condition that a detection value of the concentration sensor is less than or equal to a second threshold value.
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公开(公告)号:US20250028256A1
公开(公告)日:2025-01-23
申请号:US18707280
申请日:2021-11-17
Applicant: Tokyo Electron Limited
Inventor: Keiichi YAHATA
IPC: G03F7/00
Abstract: A substrate treatment system connected to an exposure apparatus, includes: a substrate treatment apparatus configured to perform a treatment on a substrate; and a supply apparatus configured to supply atmosphere gas during a substrate treatment to the substrate treatment apparatus, wherein: the supply apparatus includes an intake part configured to take in emission gas emitted from the exposure apparatus; and the supply apparatus regulates a temperature and/or a humidity of the emission gas taken in from the intake part and then supplies the emission gas as the atmosphere gas to the substrate treatment apparatus.
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