Piezoelectric member, piezoelectric element, and liquid discharge head and liquid discharge apparatus utilizing piezoelectric element
    1.
    发明授权
    Piezoelectric member, piezoelectric element, and liquid discharge head and liquid discharge apparatus utilizing piezoelectric element 有权
    压电元件,压电元件,以及利用压电元件的液体排出头和液体排出装置

    公开(公告)号:US07622852B2

    公开(公告)日:2009-11-24

    申请号:US12031176

    申请日:2008-02-14

    IPC分类号: H01L41/04 H01L41/187

    摘要: The invention provides a piezoelectric film having a large piezoelectric property, and a piezoelectric element, a liquid discharge head and a liquid discharge apparatus utilizing the same. The piezoelectric film is formed by an epitaxial oxide of orientation having at least a tetragonal crystal structure, in which the oxide is a perovskite type composite oxide represented by a general formula ABO3 and contains at least domains C, D and E of [100] orientation having mutual deviation in crystal direction, where the angular deviation between [100] directions in domains C and D, in domains D and E, in domains C and E and in domains D and E are respectively 5° or less, 5° or less, 0.3° or less, and 0.3° or more, and the angular deviation between [001] directions in domains C and E and in domains D and E are respectively 1.0° or more, and 1.0° or more.

    摘要翻译: 本发明提供一种压电性能大的压电膜,以及压电元件,液体排出头和利用该压电元件的液体排出装置。 压电膜由具有至少四方晶系结构的<100>取向的外延氧化物形成,其中氧化物是由通式ABO 3表示的钙钛矿型复合氧化物,并且至少含有C,D和E的畴, 100]取向在晶体方向上具有相互偏离,其中区域C和D中的结构域C和D中的结构域D和E中的区域C和E以及区域D和E中的角度偏差分别为5°或更小,5 °或更小,0.3°以下,0.3°以上,域C,E以及区域D,E的[001]方向的角度偏差分别为1.0°以上1.0°以上。

    PIEZOELECTRIC MEMBER, PIEZOELECTRIC ELEMENT, AND LIQUID DISCHARGE HEAD AND LIQUID DISCHARGE APPARATUS UTILIZING PIEZOELECTRIC ELEMENT
    2.
    发明申请
    PIEZOELECTRIC MEMBER, PIEZOELECTRIC ELEMENT, AND LIQUID DISCHARGE HEAD AND LIQUID DISCHARGE APPARATUS UTILIZING PIEZOELECTRIC ELEMENT 有权
    压电元件,压电元件和液体放电头和液体放电器件利用压电元件

    公开(公告)号:US20080211881A1

    公开(公告)日:2008-09-04

    申请号:US12031176

    申请日:2008-02-14

    IPC分类号: H01L41/187 B41J2/045

    摘要: The invention provides a piezoelectric film having a large piezoelectric property, and a piezoelectric element, a liquid discharge head and a liquid discharge apparatus utilizing the same. The piezoelectric film is formed by an epitaxial oxide of orientation having at least a tetragonal crystal structure, in which the oxide is a perovskite type composite oxide represented by a general formula ABO3 and contains at least domains C, D and E of [100] orientation having mutual deviation in crystal direction, where the angular deviation between [100] directions in domains C and D, in domains D and E, in domains C and E and in domains D and E are respectively 5° or less, 5° or less, 0.3° or less, and 0.3° or more, and the angular deviation between [001] directions in domains C and E and in domains D and E are respectively 1.0° or more, and 1.0° or more.

    摘要翻译: 本发明提供一种压电性能大的压电膜,以及压电元件,液体排出头和利用该压电元件的液体排出装置。 压电膜由具有至少四方晶系结构的<100>取向的外延氧化物形成,其中氧化物是由通式ABO 3 N表示的钙钛矿型复合氧化物,并且至少包含 [100]取向的结构域C,D和E在晶体方向上具有相互偏离,其中域C和D中的结构域C和D中的结构域D和E中,域C和E以及结构域D和E中的[100]方向之间的角度偏差 分别为5°以下,5°以下,0.3°以下,0.3°以上,区域C和E以及区域D,E的[001]方向的角度偏差分别为1.0°以上, 和1.0°以上。

    Rapid X-ray diffraction method for structural analysis of a nano material on a surface or at an interface and for structural analysis of a solid/liquid interface, and apparatus used for the method
    3.
    发明申请
    Rapid X-ray diffraction method for structural analysis of a nano material on a surface or at an interface and for structural analysis of a solid/liquid interface, and apparatus used for the method 审中-公开
    用于表面或界面上的纳米材料的结构分析和用于固/液界面的结构分析的快速X射线衍射法和用于该方法的装置

    公开(公告)号:US20060032433A1

    公开(公告)日:2006-02-16

    申请号:US11128415

    申请日:2005-05-13

    申请人: Osami Sakata

    发明人: Osami Sakata

    CPC分类号: G01N23/207

    摘要: To characterize or evaluate ultra-fine structures such as ultra-fine nanowires grown on a substrate's crystal surface, buried ultra-fine nanolines or nanowires as sandwiched between a substrate's surface and an overlying cap layer, and thin-film crystals, or to solid-liquid interfacial structures comprising a solution and a solid, 0.1 nm or shorter-wavelength x-rays are incident on their surfaces at an angle of a few degrees or less and the diffracted x-rays are recorded with a two-dimensional x-ray detector in one action within a very short period of time, whereby the intensities of the diffracted x-rays from the ultra-fine structures or solid-liquid interfacial structures are visualized in the reciprocal lattice space and their structures are rapidly analyzed.

    摘要翻译: 为了表征或评估在基板的晶体表面上生长的超细纳米线的超细结构,被掩埋的超细纳米线或纳米线夹在基板的表面和上覆盖层之间,以及薄膜晶体,或固体 - 包含溶液和固体,0.1nm或更短波长的X射线的液体界面结构以几度或更小的角度入射到它们的表面上,并且用二维x射线检测器记录衍射的X射线 在非常短的时间段内的一个动作中,由此来自超细结构或固 - 液界面结构的衍射X射线的强度在互晶格空间中可视化,并且其结构被快速分析。