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公开(公告)号：US3456115A
公开(公告)日：1969-07-15
申请号：US3456115D
申请日：1965-10-22
Applicant: UNIT PROCESS ASSEMBLIES
Inventor： LIEBER SIDNEY U , HAY WILLIAM D
IPC: G01N23/203 , G01T1/18 , G21F5/02 , H01J35/16
CPC classification number: G01N23/203
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Patent Agency Ranking2.发明授权Workpiece support and mask assemblies for radiation backscatter measuring instruments 失效辐射背板测量仪器的工作支持和面罩组件
公开(公告)号：US3421000A
公开(公告)日：1969-01-07
申请号：US3421000D
申请日：1965-10-22
Applicant: UNIT PROCESS ASSEMBLIES
Inventor： LIEBER SIDNEY U , HAY WILLIAM D
IPC: G01N23/203 , G01Q30/04 , H01J1/52
CPC classification number: G01N23/203
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公开(公告)号：US3560742A
公开(公告)日：1971-02-02
申请号：US3560742D
申请日：1967-01-17
Applicant: UNIT PROCESS ASSEMBLIES
Inventor： WEINSTOCK JACQUES J , HAY WILLIAM D
IPC: G01N23/203 , G01T1/16
CPC classification number: G01N23/203
Abstract: A portable beta backscatter measuring instrument assembly to effect measurements of the thickness of coatings on workpieces, including a jig mounted portable probe member incorporating means adjustable relative thereto to engage a workpiece, or an abutment fixed relative to a workpiece, to hold the probe member in firm engagement with a surface of the workpiece in proper position for measuring the thickness of a coating on the surface.
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4.发明授权
公开(公告)号：US3519824A
公开(公告)日：1970-07-07
申请号：US3519824D
申请日：1966-03-14
Applicant: UNIT PROCESS ASSEMBLIES
Inventor： WEINSTOCK JACQUES J , HAY WILLIAM D
IPC: G01N23/203 , G01T1/16
CPC classification number: G01N23/203
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5.发明授权Beta backscatter thickness measuring apparatus for apertures in printed circuit boards and the like 失效印刷电路板和其他类似印刷电路板的测厚仪厚度测量装置
公开(公告)号：US3588507A
公开(公告)日：1971-06-28
申请号：US3588507D
申请日：1968-04-01
Applicant: UNIT PROCESS ASSEMBLIES
Inventor： WEINSTOCK JACQUES J , HAY WILLIAM D
IPC: G01N23/203 , G01T1/16
CPC classification number: G01N23/203
Abstract: APPARATUS FOR LOCATING A BETA RAY EMITTING PROBE ASSEMBLY AND AN APERTURE IN A PRINTED CIRCUIT BOARD OR OTHER WORKPIECE AT A MEASURING STATION IN PRECISE RELATIONSHIP TO ONE ANOTHER TO EFFECT BETA BACKSCATTER-TYPE MEASUREMENTS OF THE THICKNESSES OF PLATINGS ON A PREDETERMINED AREA ON THE SIDEWALL OF A SELECTED APERTURE, INCLUDING MEANS FOR GUIDING THE PROBE ASSEMBLY FOR MOVEMENT BETWEEN A RETRACTED POSITION AND AN ADVANCED OPERATIVE MEASURING POSITION TO ASSURE DIRECTED IMPINGEMENT OF A COLLIMATED BEAM OF BETA RADIATION ON SAID PREDETERMINED AREA OF THE WALL OF ANY APERTURE SELECTED FROM A PLURALITY OF SIMILAR APERTURES IN A BOARD.
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公开(公告)号：US3496359A
公开(公告)日：1970-02-17
申请号：US3496359D
申请日：1966-02-09
Applicant: UNIT PROCESS ASSEMBLIES
Inventor： WEINSTOCK JACQUES J , WADE DONALD E , LIEBER SIDNEY U , HAY WILLIAM D
IPC: G01N23/203 , G01T1/16 , H01J39/00
CPC classification number: G01N23/203
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