公开(公告)号：US10958843B2

公开(公告)日：2021-03-23

申请号：US15971214

申请日：2018-05-04

Applicant: United Technologies Corporation

Inventor： Ziyou Xiong ,  Alan Matthew Finn ,  Richard W. Osborne, III ,  Jose Miguel Pasini ,  Edgar A. Bernal ,  Ozgur Erdinc

IPC: H04N5/232 ,  H04N5/247 ,  H04N17/00 ,  G01B11/00 ,  G01N21/88 ,  G02B21/36

Abstract: A multi-camera system for a component inspection comprising a table having a table top or, alternatively, another sufficiently rigid surface; a first camera having a narrow field-of-view lens; a second camera having a wide field-of-view lens linked to said first camera, wherein said first camera and said second camera are configured to move identical distances along a common axis relative to said table top or surface; and a pre-defined pattern defined on said table top or surface.

公开(公告)号：US20190340721A1

公开(公告)日：2019-11-07

申请号：US15970944

申请日：2018-05-04

Applicant: United Technologies Corporation

Inventor： Alan Matthew Finn ,  Jose Miguel Pasini ,  Richard W. Osborne, III ,  Edgar A. Bernal ,  Ozgur Erdinc ,  Olusegun Oshin ,  Ziyou Xiong ,  Catalin G. Fotache ,  Gene B. Donskoy ,  Sergio S. Frutuoso ,  Joseph A. Sylvestro

IPC: G06T1/00 ,  H04N5/232 ,  H04N5/235 ,  B25J9/16

Abstract: A method for robotic inspection of a part, includes the steps of: supporting the part with a robot mechanism; obtaining part-related sensor input with a sensor positioned to inspect the part supported by the robot mechanism; and controlling movement of the robot mechanism relative to the sensor, wherein the controlling is done by a feedback control unit which receives the sensor input, and the feedback control unit is configured to control the robot mechanism based upon the sensor input.

公开(公告)号：US10387803B2

公开(公告)日：2019-08-20

申请号：US15840132

申请日：2017-12-13

Applicant: UNITED TECHNOLOGIES CORPORATION

Inventor： Kishore K. Reddy ,  Edgar A. Bernal ,  Michael J. Giering ,  Ryan B. Noraas

IPC: G06T5/20 ,  G06N20/00 ,  G06K9/62 ,  G06N3/08 ,  G06N3/04

Abstract: A sensor system may comprise a sensor; a processor in electronic communication with the sensor; and/or a tangible, non-transitory memory configured to communicate with the processor, the tangible, non-transitory memory having instructions stored thereon that, in response to execution by the processor, cause the processor to perform operations. The operations may comprise recording, by the sensor, a preliminary type data sample; and/or applying, by the processor, a mapping function having a plurality of tuned parameters to the preliminary type data sample, producing a desired type data output.

公开(公告)号：US20190172191A1

公开(公告)日：2019-06-06

申请号：US16210800

申请日：2018-12-05

Applicant: United Technologies Corporation

Inventor： Alan Matthew Finn ,  Jose Miguel Pasini ,  Edgar A. Bernal ,  Ozgur Erdinc ,  Ziyou Xiong ,  Gene B. Donskoy ,  Sergio S. Frutuoso ,  Joseph A. Sylvestro ,  Richard W. Osborne, III ,  Olusegun T. Oshin ,  William L. Rall

IPC: G06T7/00 ,  G01M15/14 ,  G01B21/00 ,  G02B21/36 ,  G02B21/00

Abstract: A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to the component image; applying the baseline dimensioned image to a damage detection algorithm; and determining component damage by the damage detection algorithm.

公开(公告)号：US20190096056A1

公开(公告)日：2019-03-28

申请号：US15714339

申请日：2017-09-25

Applicant: United Technologies Corporation

Inventor： Michael J. Giering ,  Ryan B. Noraas ,  Kishore K. Reddy ,  Edgar A. Bernal

IPC: G06T7/00 ,  G06T7/13 ,  G06T7/12 ,  G06K9/62

CPC classification number: G06T7/0006 ,  G06K9/6202 ,  G06K9/6289 ,  G06T7/0004 ,  G06T7/001 ,  G06T7/12 ,  G06T7/13 ,  G06T7/174 ,  G06T2207/20076 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/20152 ,  G06T2207/20221 ,  G06T2207/30136 ,  G06T2207/30164 ,  G06T2207/30242

Abstract: A material characterization system includes an imaging unit, a material characterization controller, and an imaging unit controller. The electronic imaging unit generates a test image of a specimen composed of a material. The electronic material characterization controller determines values of a plurality of parameters and maps the parameters to corresponding ground truth labeled outputs. The mapped parameters are applied to at least one test image to predict a presence of at least one target attribute of the specimen in response to applying the learned parameters. The test image is convert to a selected output image format so as to generate a synthetic image including the predicted at least one attribute. The electronic imaging unit controller performs a material characterization analysis that characterizes the material of the specimen based on the predicted at least one attribute included in the synthetic image.

公开(公告)号：US20190339235A1

公开(公告)日：2019-11-07

申请号：US15971254

申请日：2018-05-04

Applicant: United Technologies Corporation

Inventor： Alan Matthew Finn ,  Amit Surana ,  Matthew O. Williams ,  Edgar A. Bernal ,  Ozgur Erdinc

IPC: G01N29/34 ,  G01N29/22 ,  G06T7/00 ,  G01N25/72 ,  G01N21/71 ,  G01N29/46

Abstract: A method for nondestructive vibrothermography inspection of a component, the method includes generating ultrasonic excitations in a component over a range of frequencies; determining a thermal signature in the component from the excitations; registering a model with the thermal signature; determining damage based on the thermal signal and model; and classifying the component based on the determining.

公开(公告)号：US20190339234A1

公开(公告)日：2019-11-07

申请号：US15971270

申请日：2018-05-04

Applicant: United Technologies Corporation

Inventor： Alan Matthew Finn ,  Amit Surana ,  Matthew O. Williams ,  Edgar A. Bernal ,  Ozgur Erdinc

IPC: G01N29/26 ,  G01N29/11 ,  G01N29/44

Abstract: A method for nondestructive inspection of a component, the method includes determining a first pulse-echo scan from a first side of a component; determining a second pulse-echo scan from a second side of the component; determining a through-transmission scan based on the, first pulse-echo scan, the second pulse-echo scan, and a model of the component, the model comprises a rigid internal structure of the component; and classifying the component based on comparing the through-transmission scan to a “gold” model.

公开(公告)号：US10928362B2

公开(公告)日：2021-02-23

申请号：US15971270

申请日：2018-05-04

Applicant: United Technologies Corporation

Inventor： Alan Matthew Finn ,  Amit Surana ,  Matthew O. Williams ,  Edgar A. Bernal ,  Ozgur Erdinc

IPC: G01N29/26 ,  G01N29/11 ,  G01N29/44

Abstract: A method for nondestructive inspection of a component, the method includes determining a first pulse-echo scan from a first side of a component; determining a second pulse-echo scan from a second side of the component; determining a through-transmission scan based on the first pulse-echo scan, the second pulse-echo scan, and a model of the component, the model comprises a rigid internal structure of the component; and classifying the component based on comparing the through-transmission scan to a “gold” model.

公开(公告)号：US10733721B2

公开(公告)日：2020-08-04

申请号：US16549332

申请日：2019-08-23

Applicant: United Technologies Corporation

Inventor： Michael J. Giering ,  Ryan B. Noraas ,  Kishore K. Reddy ,  Edgar A. Bernal

IPC: G06T7/00 ,  G06T7/13 ,  G06T7/12 ,  G06K9/62 ,  G06K9/34 ,  G06T7/174

Abstract: A material characterization system includes an imaging unit, a material characterization controller, and an imaging unit controller. The electronic imaging unit generates a test image of a specimen composed of a material. The electronic material characterization controller determines values of a plurality of parameters and maps the parameters to corresponding ground truth labeled outputs. The mapped parameters are applied to at least one test image to predict a presence of at least one target attribute of the specimen in response to applying the learned parameters. The test image is convert to a selected output image format so as to generate a synthetic image including the predicted at least one attribute. The electronic imaging unit controller performs a material characterization analysis that characterizes the material of the specimen based on the predicted at least one attribute included in the synthetic image.

公开(公告)号：US20190378267A1

公开(公告)日：2019-12-12

申请号：US16549332

申请日：2019-08-23

Applicant: United Technologies Corporation

Inventor： Michael J. Giering ,  Ryan B. Noraas ,  Kishore K. Reddy ,  Edgar A. Bernal

IPC: G06T7/00 ,  G06T7/13 ,  G06T7/12 ,  G06K9/62

Abstract: A material characterization system includes an imaging unit, a material characterization controller, and an imaging unit controller. The electronic imaging unit generates a test image of a specimen composed of a material. The electronic material characterization controller determines values of a plurality of parameters and maps the parameters to corresponding ground truth labeled outputs. The mapped parameters are applied to at least one test image to predict a presence of at least one target attribute of the specimen in response to applying the learned parameters. The test image is convert to a selected output image format so as to generate a synthetic image including the predicted at least one attribute. The electronic imaging unit controller performs a material characterization analysis that characterizes the material of the specimen based on the predicted at least one attribute included in the synthetic image.