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公开(公告)号:US11955170B2
公开(公告)日:2024-04-09
申请号:US18235954
申请日:2023-08-21
Applicant: UNTETHER AI CORPORATION
IPC: G11C11/418 , G11C11/4074 , G11C11/408 , G11C11/4094 , G11C11/4096 , G11C11/412 , G11C11/419
CPC classification number: G11C11/418 , G11C11/4074 , G11C11/4085 , G11C11/4094 , G11C11/4096 , G11C11/412 , G11C11/419
Abstract: A static random-access memory is set forth comprising: a word line circuit for generating a word line signal on a word line; a plurality of six-transistor memory cells arranged between a first bitline, a second bitline and the word line for simultaneously selecting one of either all or a portion of the plurality of six-transistor memory cells for data reading or writing, and wherein each memory cell includes first and second n-channel transistors and a bitline precharge circuit for precharging the first bitline and second bitline to a voltage of Vdd/2 prior to the first and second n-channel transistors receiving the word line signal.
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公开(公告)号:US11990181B2
公开(公告)日:2024-05-21
申请号:US18251251
申请日:2022-06-21
Applicant: UNTETHER AI CORPORATION
Inventor: Katsuyuki Sato , William Martin Snelgrove , Saijagan Saijagan
IPC: G11C11/419 , G11C5/14 , G11C7/10 , G11C7/12 , G11C7/18
CPC classification number: G11C11/419 , G11C5/14 , G11C7/1048 , G11C7/12 , G11C7/18
Abstract: A low-power static random access memory (SRAM) is set forth which includes a cache memory function without requiring a special bit cell, and which realizes robust read and write operation without any write assist circuit at 16 nm or below FinFET technology. The SRAM comprises a half-Vdd precharge 6T SRAM cell array for robust operation at low supply voltage at 16 nm or below, and with cacheable dynamic flip-flop based differential amplifier referred to as a main amplifier (MA). Prior art 6T SRAM cell arrays use Vdd or Vdd-Vth precharge schemes, and have separate read and write amplifiers. The SRAM set forth uses one main amplifier only, which is connected to the bit line (BL) through a transmission gate. The main amplifiers functions as a read amplifier, write amplifier, and a cache memory.
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公开(公告)号:US12237008B2
公开(公告)日:2025-02-25
申请号:US18000694
申请日:2022-06-21
Applicant: UNTETHER AI CORPORATION
IPC: G11C11/419 , G11C11/4074 , G11C11/408 , G11C11/4094 , G11C11/4096 , G11C11/412 , G11C11/418
Abstract: A static random-access memory is set forth comprising: a word line circuit for generating a word line signal on a word line; a plurality of six-transistor memory cells arranged between a first bitline, a second bitline and the word line for simultaneously selecting one of either all or a portion of the plurality of six-transistor memory cells for data reading or writing, and wherein each memory cell includes first and second n-channel transistors and a bitline precharge circuit for precharging the first bitline and second bitline to a voltage of Vdd/2 prior to the first and second n-channel transistors receiving the word line signal.
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