摘要:
Methods and systems are provided for determining efficacy of stress protection circuitry. The methods and systems employ a ring oscillator that models at least one parameter of a functional circuit to be protected by the stress protection circuit. A stress signal is applied to the ring oscillator and parametric degradation is measured to determine the effectiveness of the stress protection circuit in protecting the ring oscillator. A stress signal can be a voltage or current that stresses the normal operation of a functional circuit. The parametric degradation of the ring oscillator can be correlated to the parametric degradation that would be experienced by the functional circuit.
摘要:
A circuit includes an input terminal and an electrostatic discharge (ESD) protection circuit. The ESD protection circuit includes a diode string formed from a plurality of P-N junction devices arranged in series. The diode string includes an input coupled to the input terminal and includes at least one output coupled to a power supply terminal. The circuit further includes a plurality of shunt elements. Each of the plurality of shunt elements includes a first terminal coupled to one of the plurality of P-N junction devices and a second terminal coupled to the power supply terminal. Each of the plurality of shunt elements is controllable to selectively couple the one of the plurality of P-N junction devices to the power supply terminal to distribute current flow across the diode string in response to an ESD event.
摘要:
An integrated circuit includes first and second terminals. The integrated circuit further includes a first plurality of diodes arranged in series between the first terminal and a power supply terminal and a second plurality of diodes arranged in series between the second terminal and the power supply terminal. The integrated circuit also includes a conductor configured to couple a first node within the first plurality of diodes to a second node within the second plurality of diodes. The first node is located between a first diode of the first plurality of diodes and a last diode of the first plurality of diodes, and the second node is located between a first diode of the second plurality of diodes and a last diode of the second plurality of diodes.
摘要:
An integrated circuit includes first and second terminals. The integrated circuit further includes a first plurality of diodes arranged in series between the first terminal and a power supply terminal and a second plurality of diodes arranged in series between the second terminal and the power supply terminal. The integrated circuit also includes a conductor configured to couple a first node within the first plurality of diodes to a second node within the second plurality of diodes. The first node is located between a first diode of the first plurality of diodes and a last diode of the first plurality of diodes, and the second node is located between a first diode of the second plurality of diodes and a last diode of the second plurality of diodes.
摘要:
An integrated circuit includes a plurality of terminals, an unterminated diode string formed from a plurality of P-N junction devices arranged in series and coupled to the plurality of terminals, and a plurality of switches. Each of the plurality of switches includes a first terminal coupled to an anode of one of the plurality of P-N junction devices and a second terminal coupled to a power supply terminal, and is controllable to selectively couple the anode to the power supply terminal in response to an ESD event. The plurality of switches configured to dissipate an ESD current associated with the ESD event and dynamically terminate the unterminated diode string at a node where the ESD current falls below a turn-on threshold of a next P-N junction device in the unterminated diode string.
摘要:
Electrostatic discharge protection circuitry includes a timing circuit operably coupled between the high supply side and low supply side of an associated circuit. The timing circuit has an RC node used for triggering a series of inverters configured to control an ESD dissipation device operably coupled to the high supply side node and the low side supply node of the circuit. A feedback transistor network and a feedback conditioning network is provided for ensuring that the ESD device is held on during an ESD event.
摘要:
An integrated circuit includes a plurality of terminals, an unterminated diode string formed from a plurality of P-N junction devices arranged in series and coupled to the plurality of terminals, and a plurality of switches. Each of the plurality of switches includes a first terminal coupled to an anode of one of the plurality of P-N junction devices and a second terminal coupled to a power supply terminal, and is controllable to selectively couple the anode to the power supply terminal in response to an ESD event. The plurality of switches configured to dissipate an ESD current associated with the ESD event and dynamically terminate the unterminated diode string at a node where the ESD current falls below a turn-on threshold of a next P-N junction device in the unterminated diode string.
摘要:
A circuit includes an input terminal and an electrostatic discharge (ESD) protection circuit. The ESD protection circuit includes a diode string formed from a plurality of P-N junction devices arranged in series. The diode string includes an input coupled to the input terminal and includes at least one output coupled to a power supply terminal. The circuit further includes a plurality of shunt elements. Each of the plurality of shunt elements includes a first terminal coupled to one of the plurality of P-N junction devices and a second terminal coupled to the power supply terminal. Each of the plurality of shunt elements is controllable to selectively couple the one of the plurality of P-N junction devices to the power supply terminal to distribute current flow across the diode string in response to an ESD event.
摘要:
Methods and circuits are disclosed for providing distributed ESD protection switchable between a capacitive decoupling state and an ESD protection state. The invention provides electronic circuitry with a selectable capacitive decoupling path and an ESD shunting path responsive to the detection of the presence or absence of an electrostatic discharge event. Circuits of the invention include one or more control circuits, electrostatic discharge devices, and control nodes operably coupled to responsively switch the circuit from a decoupling state to an electrostatic discharge state.