Device for interferential distance measurement
    1.
    发明申请
    Device for interferential distance measurement 有权
    干涉距离测量装置

    公开(公告)号:US20110235051A1

    公开(公告)日:2011-09-29

    申请号:US13065369

    申请日:2011-03-21

    IPC分类号: G01B11/02

    摘要: A device for interferential distance measurement that includes a light source that emits a light beam along a propagation direction and a scanning plate including a splitter that splits the light beam into a measurement beam and a reference beam. The device further including a reflector disposed spaced-apart in a direction of the propagation direction and a detector element. The measurement beam and the reference beam are propagated from the splitter along different optical paths toward the reflector, where a back reflection of the measurement beam and the reference beam occurs at the reflector toward the scanning plate. In addition, at a combining location the measurement beam and the reference beam attain interfering superposition, and wherein the measurement beam and the reference beam interfering at the combining location are detected by the detector element so that the detector element generates a distance signal regarding a distance between the scanning plate and the reflector.

    摘要翻译: 一种用于干涉距离测量的装置,包括沿着传播方向发射光束的光源和包括将光束分裂成测量光束和参考光束的分离器的扫描板。 所述装置还包括沿传播方向的方向间隔布置的反射器和检测器元件。 测量光束和参考光束从分离器沿着不同的光路传播到反射器,其中测量光束和参考光束的反射在反射器处朝向扫描板发生。 另外,在组合位置处,测量光束和参考光束达到干涉叠加,并且其中在组合位置处干扰的测量光束和参考光束被检测器元件检测,使得检测器元件产生关于距离的距离信号 在扫描板和反射器之间。

    Device for interferential distance measurement
    2.
    发明授权
    Device for interferential distance measurement 有权
    干涉距离测量装置

    公开(公告)号:US09080857B2

    公开(公告)日:2015-07-14

    申请号:US13065369

    申请日:2011-03-21

    摘要: A device for interferential distance measurement that includes a light source that emits a light beam along a propagation direction and a scanning plate including a splitter that splits the light beam into a measurement beam and a reference beam. The device further including a reflector disposed spaced-apart in a direction of the propagation direction and a detector element. The measurement beam and the reference beam are propagated from the splitter along different optical paths toward the reflector, where a back reflection of the measurement beam and the reference beam occurs at the reflector toward the scanning plate. In addition, at a combining location the measurement beam and the reference beam attain interfering superposition, and wherein the measurement beam and the reference beam interfering at the combining location are detected by the detector element so that the detector element generates a distance signal regarding a distance between the scanning plate and the reflector.

    摘要翻译: 一种用于干涉距离测量的装置,包括沿传播方向发射光束的光源和包括将光束分成测量光束和参考光束的分离器的扫描板。 所述装置还包括沿传播方向的方向间隔布置的反射器和检测器元件。 测量光束和参考光束从分离器沿着不同的光路传播到反射器,其中测量光束和参考光束的反射在反射器处朝向扫描板发生。 另外,在组合位置处,测量光束和参考光束达到干涉叠加,并且其中在组合位置处干扰的测量光束和参考光束被检测器元件检测,使得检测器元件产生关于距离的距离信号 在扫描板和反射器之间。

    Optical position-measuring device having two crossed scales
    3.
    发明授权
    Optical position-measuring device having two crossed scales 有权
    具有两个十字刻度的光学位置测量装置

    公开(公告)号:US08822907B2

    公开(公告)日:2014-09-02

    申请号:US13288007

    申请日:2011-11-02

    IPC分类号: G01D5/34 G01B11/24 G01D5/38

    CPC分类号: G01D5/38 G01B11/2441

    摘要: An optical position-measuring device includes a scanning bar extending in a first or second direction, and a scale extending in the other direction. The scale is offset by a scanning distance from the scanning bar in a third direction perpendicular to the first and second directions. The device has a light source whose light penetrates the scanning bar at an intersection point of the scanning bar and scale to fall on the scale and arrive back at the scanning bar. At a detector, the light is split by diffraction into different partial beams at optically effective structures of the scanning bar and scale and combined again. A periodic signal is obtained in the detector in response to: a shift between the scanning bar and scale in the first direction due to interference of combined partial beams, and a change in the scanning distance between the scanning bar and scale.

    摘要翻译: 光学位置测量装置包括沿第一或第二方向延伸的扫描杆和沿另一个方向延伸的刻度。 在与第一和第二方向垂直的第三方向上,刻度尺距离扫描杆的扫描距离偏移。 该装置具有光源,其光在扫描条和刻度的交点处穿过扫描条,落在刻度上并返回扫描条。 在检测器处,通过衍射将光分解成不同的部分光束,在扫描条和刻度的光学有效结构上再次组合。 在检测器中响应于由于组合的部分光束的干扰而在第一方向上的扫描条和标尺之间的偏移以及扫描条和标尺之间的扫描距离的变化而在检测器中获得周期性信号。

    Optical Position-Measuring Device
    4.
    发明申请
    Optical Position-Measuring Device 有权
    光学位置测量装置

    公开(公告)号:US20120112050A1

    公开(公告)日:2012-05-10

    申请号:US13288007

    申请日:2011-11-02

    IPC分类号: G01D5/347

    CPC分类号: G01D5/38 G01B11/2441

    摘要: An optical position-measuring device includes a scanning bar extending in a first or second direction, and a scale extending in the other direction. The scale is offset by a scanning distance from the scanning bar in a third direction perpendicular to the first and second directions. The device has a light source whose light penetrates the scanning bar at an intersection point of the scanning bar and scale to fall on the scale and arrive back at the scanning bar. At a detector, the light is split by diffraction into different partial beams at optically effective structures of the scanning bar and scale and combined again. A periodic signal is obtained in the detector in response to: a shift between the scanning bar and scale in the first direction due to interference of combined partial beams, and a change in the scanning distance between the scanning bar and scale.

    摘要翻译: 光学位置测量装置包括沿第一或第二方向延伸的扫描杆和沿另一个方向延伸的刻度。 在与第一和第二方向垂直的第三方向上,刻度尺距离扫描杆的扫描距离偏移。 该装置具有光源,其光在扫描条和刻度的交点处穿过扫描条,落在刻度上并返回扫描条。 在检测器处,通过衍射将光分解成不同的部分光束,在扫描条和刻度的光学有效结构上再次组合。 在检测器中响应于由于组合的部分光束的干扰而在第一方向上的扫描条和标尺之间的偏移以及扫描条和标尺之间的扫描距离的变化而在检测器中获得周期性信号。

    Optical measuring system
    5.
    发明授权
    Optical measuring system 失效
    光学测量系统

    公开(公告)号:US06552810B1

    公开(公告)日:2003-04-22

    申请号:US09496984

    申请日:2000-02-02

    IPC分类号: G01B1114

    CPC分类号: G01D5/36

    摘要: An optical position measuring system for determining the relative position of a first object which can be moved with respect to a second object along a measuring direction includes at least one periodic measuring graduation, which is connected to the first object and a scanning unit which is connected with the second object. The scanning unit includes a light source emitting beams of light, at least one scanning graduation and a detector arrangement in a detector plane. The detector arrangement includes several radiation sensitive detector elements for scanning a periodic fringe pattern resulting from the interaction of the beams of light emitted by the light source with the at least one periodic measuring graduation and the at least one scanning graduation, wherein the detector plane is arranged spaced at a distance Zn from the last graduation passed and the distance Zn is calculated from the following equation: 1/Zn+1/ZQ=1/((n+&eegr;)*dVTO), wherein: ZQ: is the distance of the last graduation passed from a real and virtual source point of the periodic fringe pattern, n=0, 1, 2, 3, . . . , &eegr;: is the phase shift in fractions of 360° of the periodic fringe pattern exiting at the last graduation passed into different directions, dVTO=(TPeff*&Lgr;vernier)/&lgr;,  wherein TPeff: is an effective graduation period of the scanning device, which correctly describes the directions of the orders of diffraction exiting at the graduations last passed, which have sufficient intensity, &lgr;: wavelength of said light source, &Lgr;vemier: period of said partial vernier fringe at the location of the last graduation passed.

    摘要翻译: 一种光学位置测量系统,用于确定可沿着测量方向相对于第二物体移动的第一物体的相对位置,包括连接到第一物体的至少一个周期性测量刻度和连接到第一物体的扫描单元 与第二个对象。 扫描单元包括在检测器平面中发射光束的光源,至少一个扫描刻度和检测器装置。 检测器装置包括若干辐射敏感检测器元件,用于扫描由光源发射的光束与至少一个周期性测量刻度和至少一个扫描刻度的相互作用产生的周期性条纹图案,其中检测器平面是 排列间隔距离最后一个刻度的Zn距离,距离Zn由以下等式计算:其中:ZQ:是从周期性条纹图案的实际和虚拟源点通过的最后一个刻度的距离,n = 0 ,1,2,3,。 。 。 ,eta:是在最后一刻度出现的周期性条纹图案的360°的分数相移到不同的方向,其中TPeff是扫描装置的有效刻度周期,其正确地描述了衍射次数的方向 在最后一次毕业的毕业生,具有足够的强度,羔羊:所述光源的波长,LAMBDVEMier:在最后毕业的位置通过的所述部分游标边缘的时期。

    Interferential position measuring arrangement
    6.
    发明授权
    Interferential position measuring arrangement 有权
    干涉位置测量装置

    公开(公告)号:US07154609B2

    公开(公告)日:2006-12-26

    申请号:US10635422

    申请日:2003-08-06

    IPC分类号: G01B9/02

    CPC分类号: G01D5/38

    摘要: An interferential position measuring arrangement including a light source, which emits a beam of rays and an optical element, which converts the beam of rays emitted by the light source into an incoming beam of rays. A scale grating which splits the incoming beam of rays into a first partial beam of rays and a second partial beam of rays. A first scanning grating that causes splitting of the first partial beam of rays and a second scanning grating that causes splitting of the second partial beam of rays, wherein a periodically modulated interferential fringe pattern with definite spatial interferential fringe pattern period results in a detection plane. A detection arrangement which causes splitting of light entering through the detection arrangement into at least three different spatial directions and optoelectronic detector elements arranged in the at least three spatial directions for detecting phase-shifted scanning signal.

    摘要翻译: 一种包括发射光束的光源和光学元件的干涉位置测量装置,其将由光源发射的光线转换成输入的光束。 将光束入射到第一部分射线束和第二部分射线束的刻度光栅。 使第一部分光束分裂的第一扫描光栅和引起第二部分光束分裂的第二扫描光栅,其中具有确定的空间干涉条纹图案周期的周期性调制的干涉条纹图案导致检测平面。 一种检测装置,其使通过检测装置进入的光分裂成至少三个不同的空间方向,并且在至少三个空间方向上布置的光电检测器元件用于检测相移的扫描信号。

    Optical position-measuring device
    7.
    发明授权
    Optical position-measuring device 有权
    光学位置测量装置

    公开(公告)号:US08890057B2

    公开(公告)日:2014-11-18

    申请号:US13472274

    申请日:2012-05-15

    申请人: Michael Hermann

    发明人: Michael Hermann

    IPC分类号: G01D5/38 G01D5/36

    CPC分类号: G01D5/366 G01D5/38

    摘要: An optical position-measuring device includes a measuring standard and a scanning unit. The measuring standard includes an incremental graduation and at least one reference marking at a reference position. The reference marking has two reference-marking subfields disposed in mirror symmetry relative to a reference-marking axis of symmetry, each of the subfields including a grating structure having a locally changeable graduation period. The scanning unit includes a divergently emitting light source, one or more gratings, and a reference-signal detector system. The reference-signal detector system has at least four detector arrays formed and positioned such that, from the scanning of the reference marking via the reference-signal detector system, first and second pairs of partial reference signals result, in each case having a signal pattern in phase opposition. The first pair of partial reference signals is offset by an offset amount relative to the second pair of partial reference signals.

    摘要翻译: 光学位置测量装置包括测量标准和扫描单元。 测量标准包括增量刻度和参考位置上的至少一个参考标记。 参考标记具有相对于参考标记对称轴以镜像对称的两个参考标记子场,每个子场包括具有局部可变的刻度周期的光栅结构。 扫描单元包括分散发射光源,一个或多个光栅和参考信号检测器系统。 参考信号检测器系统具有形成和定位的至少四个检测器阵列,使得从参考标记经由参考信号检测器系统的扫描,得到第一和第二对部分参考信号,在每种情况下都具有信号模式 同阶段反对。 第一对部分参考信号相对于第二对部分参考信号偏移偏移量。

    Partially transparent sun collector having a sun protection function
    8.
    发明授权
    Partially transparent sun collector having a sun protection function 有权
    具有防晒功能的部分透明太阳收集器

    公开(公告)号:US08607781B2

    公开(公告)日:2013-12-17

    申请号:US12306039

    申请日:2007-06-27

    IPC分类号: F24J2/24

    摘要: The present invention relates to a sun collector comprising a flat absorber body (1) on or in which one or more absorber channels (17) for the flow of a heat transfer medium are configured. In areas which are not occupied by the one or more absorber channels (17), the absorber body (1) of the present sun collector has penetrable openings (4, 10, 13) for sunlight to pass through. The sun collector therefore provides the double function of a sun collector with a partially transparent sun protection device.

    摘要翻译: 本发明涉及一种太阳能收集器,其包括在其上配置有用于传热介质流的一个或多个吸收通道(17)的平坦吸收体(1)。 在没有被一个或多个吸收通道(17)占据的区域中,本太阳能收集器的吸收体(1)具有用于阳光通过的可穿透开口(4,10,13)。 因此,太阳能收集器提供具有部分透明防晒装置的太阳收集器的双重功能。

    Optical Position-Measuring Device
    10.
    发明申请
    Optical Position-Measuring Device 有权
    光学位置测量装置

    公开(公告)号:US20110188055A1

    公开(公告)日:2011-08-04

    申请号:US13061485

    申请日:2009-07-08

    申请人: Michael Hermann

    发明人: Michael Hermann

    IPC分类号: G11B11/14

    CPC分类号: G01D5/38

    摘要: An optical position-measuring device for detecting the position of two objects movable relative to each other in at least one measuring direction includes a measuring standard which is joined to one of the two objects and possesses an incremental graduation extending in the measuring direction, as well as at least one reference marking at a reference position. The reference marking includes two reference-marking subfields disposed in mirror symmetry with respect to a reference-marking axis of symmetry, each of the subfields being made up of a structure extending in the measuring direction and having a locally changeable graduation period. In addition, the position-measuring device has a scanning unit which is joined to the other of the two objects and to which a scanning device is assigned that is used to generate at least one reference signal at the reference position. The scanning device includes at least one light source emitting divergently in the direction of the measuring standard, as well as a detector system having elements which are disposed along the measuring direction such that, starting from a central detector-system axis of symmetry in the measuring direction, the center-to-center distances between adjacent elements in the same direction change like the graduation periods of the structures in the reference-marking subfields starting from the reference-marking axis of symmetry.

    摘要翻译: 用于检测在至少一个测量方向上相对于彼此移动的两个物体的位置的光学位置测量装置包括测量标准,其连接到两个物体之一并且具有在测量方向上延伸的渐变刻度 作为参考位置处的至少一个参考标记。 参考标记包括相对于参考标记对称轴对称设置的两个参考标记子场,每个子场由在测量方向上延伸并且具有局部可变的刻度周期的结构构成。 此外,位置测量装置具有连接到两个物体中的另一个的扫描单元,并且分配有用于在基准位置产生至少一个参考信号的扫描装置。 扫描装置包括沿测量标准方向发散的至少一个光源,以及具有沿着测量方向设置的元件的检测器系统,使得从测量的中心检测器系统对称轴开始 方向,相同方向上的相邻元件之间的中心到中心的距离如从基准标记对称轴开始的参考标记子场中的结构的刻度周期改变。