摘要:
Provided is a semiconductor memory apparatus that may use an efficient protocol between an NAND flash memory device and a controller to reduce bus traffic. The flash memory device may include a memory cell array and an error correction encoder. The memory cell array may include a plurality of pages. The error correction encoder may generate first parity data based on normal data to be written to the memory cell array, compare the first parity data and second parity data encoded with the normal data stored in the memory cell array, and check an error. The error position detector may detect an error position in response to the error signal transmitted from the error correction encoder. Thus, since the semiconductor memory apparatus may transmit and receives parity data or a syndrome between an NAND flash memory device and the controller by detecting and correcting an error in the same memory chip, bus traffic may be reduced.
摘要:
Provided is a semiconductor memory apparatus that may use an efficient protocol between an NAND flash memory device and a controller to reduce bus traffic. The flash memory device may include a memory cell array and an error correction encoder. The memory cell array may include a plurality of pages. The error correction encoder may generate first parity data based on normal data to be written to the memory cell array, compare the first parity data and second parity data encoded with the normal data stored in the memory cell array, and check an error. The error position detector may detect an error position in response to the error signal transmitted from the error correction encoder. Thus, since the semiconductor memory apparatus may transmit and receives parity data or a syndrome between an NAND flash memory device and the controller by detecting and correcting an error in the same memory chip, bus traffic may be reduced.
摘要:
A skin impedance model of a predetermined part of a living body, which is an object to be measured, wherein the skin impedance model is estimated by providing a predetermined current between two ends of the predetermined part and measuring a voltage between the two ends, the model including a first area having a first resistor and a first constant phase element (CPE) connected in parallel, a second area having a second resistor and a second CPE connected in parallel, and a third resistor serially connected to the parallel connection of the second resistor and the second CPE, and a third area having a fourth resistor and a third CPE connected in parallel, wherein the second area and the third area are connected in parallel and are serially connected to the first area through a fifth resistor.
摘要:
A storage device comprises at least one nonvolatile memory and a lock mode management module. The lock mode management module places the storage device in a soft lock mode in which only predetermined writing operations are allowed, upon determining that a number of reserved blocks in a flash memory is less than or equal to a reference value.