Method and system for measuring the thickness of an object
    5.
    发明授权
    Method and system for measuring the thickness of an object 有权
    测量物体厚度的方法和系统

    公开(公告)号:US08749230B1

    公开(公告)日:2014-06-10

    申请号:US12903351

    申请日:2010-10-13

    IPC分类号: G01B7/06

    CPC分类号: G01B7/10 G01B2210/42

    摘要: Methods and systems are provided for measuring a thickness of an object. A first portion of a device is positioned on a first side of the object, and a second portion of the device is positioned on an opposite side of the object. The first portion includes at least one first mount and at least one eddy current sensor coupled to the first mount. The second portion includes at least one second mount and at least one target coupled to the second mount. The first mount is magnetically coupled to the second mount such that the eddy current sensor is oriented to interact with the target to enable the thickness of the object to be measured.

    摘要翻译: 提供了用于测量物体厚度的方法和系统。 装置的第一部分位于物体的第一侧上,并且装置的第二部分位于物体的相对侧上。 第一部分包括耦合到第一安装件的至少一个第一安装件和至少一个涡流传感器。 第二部分包括至少一个第二安装件和耦合到第二安装件的至少一个目标件。 第一安装件磁耦合到第二安装件,使得涡流传感器被定向成与目标相互作用以使物体的厚度能够被测量。