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公开(公告)号:US11268981B2
公开(公告)日:2022-03-08
申请号:US16466217
申请日:2017-12-14
申请人: XCERRA CORPORATION
发明人: Valts Treibergs , James Brandes , Travis Evans
摘要: A test probe for use with a testing apparatus. The test probe includes a first portion, a second portion, and a third portion, with hinges between the first and second portions and the second and third portions. The first portion folded at the first hinge over the second portion, the third portion folded at the second hinge over the second portion, where the second portion is stacked between the first portion and the third portion. The test probe is compressible from a first uncompressed state to a second compressed state.
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公开(公告)号:US12123897B2
公开(公告)日:2024-10-22
申请号:US17127751
申请日:2020-12-18
申请人: XCERRA CORPORATION
发明人: James Hattis , Travis Evans , Waqas Muzammil , Yukang Feng , Jason Mroczkowski , Marty Cavegn
IPC分类号: G01R1/067 , G01R1/02 , G01R1/04 , G01R1/073 , G01R31/26 , G01R31/28 , H01R13/22 , H01R13/405
CPC分类号: G01R1/067 , G01R31/2886 , H01R13/22 , H01R13/405
摘要: A test contactor is disclosed. The test contactor includes two or more dielectric layers and a test probe embedded in the one or more dielectric layers. The test contactor traverses the one or more dielectric layers. The test probe to include an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port.
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公开(公告)号:US20210190821A1
公开(公告)日:2021-06-24
申请号:US17127751
申请日:2020-12-18
申请人: XCERRA CORPORATION
发明人: James Hattis , Travis Evans , Waqas Muzammil , Yukang Feng , Jason Mroczkowski , Marty Cavegn
IPC分类号: G01R1/067 , H01R13/405 , H01R13/22 , G01R31/28
摘要: A test contactor is disclosed. The test contactor includes two or more dielectric layers and a test probe embedded in the one or more dielectric layers. The test contactor traverses the one or more dielectric layers. The test probe to include an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port.
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公开(公告)号:US20200064373A1
公开(公告)日:2020-02-27
申请号:US16466217
申请日:2017-12-14
申请人: XCERRA CORPORATION
发明人: Valts Treibergs , James Brandes , Travis Evans
摘要: A test probe for use with a testing apparatus. The test probe includes a first portion, a second portion, and a third portion, with hinges between the first and second portions and the second and third portions. The first portion folded at the first hinge over the second portion, the third portion folded at the second hinge over the second portion, where the second portion is stacked between the first portion and the third portion. The test probe is compressible from a first uncompressed state to a second compressed state.
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