公开(公告)号：US11275038B2

公开(公告)日：2022-03-15

申请号：US17054457

申请日：2019-05-15

Applicant: XENOCS SAS

Inventor： Peter Hoghoj ,  Blandine Lantz ,  Karsten Joensen ,  Soren Skou

IPC: G01N23/201 ,  G01N23/207

Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.

公开(公告)号：US11796485B2

公开(公告)日：2023-10-24

申请号：US17621005

申请日：2020-12-29

Applicant: XENOCS SAS

Inventor： Peter Hoghoj ,  Blandine Lantz

IPC: G01N23/201 ,  G01N23/041 ,  G01N23/207

CPC classification number: G01N23/041 ,  G01N23/201 ,  G01N23/207 ,  G01N2223/054 ,  G21K2201/067

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.