METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE
    1.
    发明申请
    METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE 有权
    在互连结构中形成障碍物应用层的方法

    公开(公告)号:US20100006425A1

    公开(公告)日:2010-01-14

    申请号:US12562607

    申请日:2009-09-18

    IPC分类号: C23C14/34

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical vapor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)室中,将至少两种反应性气体和惰性气体供应到PVD室中,在存在的情况下从设置在处理室中的靶溅射源材料 的由所述气体混合物形成的等离子体,并且从所述源材料在所述衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    Methods of forming a layer for barrier applications in an interconnect structure
    2.
    发明授权
    Methods of forming a layer for barrier applications in an interconnect structure 有权
    在互连结构中形成屏障应用层的方法

    公开(公告)号:US07618893B2

    公开(公告)日:2009-11-17

    申请号:US12041804

    申请日:2008-03-04

    IPC分类号: H01L21/44

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical valor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)室中,将至少两种反应性气体和惰性气体供应到PVD室中,在存在的情况下从设置在处理室中的靶溅射源材料 的由所述气体混合物形成的等离子体,并且从所述源材料在所述衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    Methods of forming a layer for barrier applications in an interconnect structure
    3.
    发明授权
    Methods of forming a layer for barrier applications in an interconnect structure 有权
    在互连结构中形成屏障应用层的方法

    公开(公告)号:US08168543B2

    公开(公告)日:2012-05-01

    申请号:US12562607

    申请日:2009-09-18

    IPC分类号: H01L21/311

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical vapor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)室中,将至少两种反应性气体和惰性气体供应到PVD室中,在存在的情况下从设置在处理室中的靶溅射源材料 的由所述气体混合物形成的等离子体,并且从所述源材料在所述衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE
    4.
    发明申请
    METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE 有权
    在互连结构中形成障碍物应用层的方法

    公开(公告)号:US20090227105A1

    公开(公告)日:2009-09-10

    申请号:US12041804

    申请日:2008-03-04

    IPC分类号: H01L21/44 H01L21/285

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical vapor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD processing chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)腔室中,将至少两种反应性气体和惰性气体供应到PVD处理腔室中,将来自设置在处理室中的靶的源材料溅射在 存在由气体混合物形成的等离子体,并且从源材料在衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。