METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE
    1.
    发明申请
    METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE 有权
    在互连结构中形成障碍物应用层的方法

    公开(公告)号:US20100006425A1

    公开(公告)日:2010-01-14

    申请号:US12562607

    申请日:2009-09-18

    IPC分类号: C23C14/34

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical vapor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)室中,将至少两种反应性气体和惰性气体供应到PVD室中,在存在的情况下从设置在处理室中的靶溅射源材料 的由所述气体混合物形成的等离子体,并且从所述源材料在所述衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    Methods of forming a layer for barrier applications in an interconnect structure
    2.
    发明授权
    Methods of forming a layer for barrier applications in an interconnect structure 有权
    在互连结构中形成屏障应用层的方法

    公开(公告)号:US07618893B2

    公开(公告)日:2009-11-17

    申请号:US12041804

    申请日:2008-03-04

    IPC分类号: H01L21/44

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical valor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)室中,将至少两种反应性气体和惰性气体供应到PVD室中,在存在的情况下从设置在处理室中的靶溅射源材料 的由所述气体混合物形成的等离子体,并且从所述源材料在所述衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    Methods of forming a layer for barrier applications in an interconnect structure
    3.
    发明授权
    Methods of forming a layer for barrier applications in an interconnect structure 有权
    在互连结构中形成屏障应用层的方法

    公开(公告)号:US08168543B2

    公开(公告)日:2012-05-01

    申请号:US12562607

    申请日:2009-09-18

    IPC分类号: H01L21/311

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical vapor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)室中,将至少两种反应性气体和惰性气体供应到PVD室中,在存在的情况下从设置在处理室中的靶溅射源材料 的由所述气体混合物形成的等离子体,并且从所述源材料在所述衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE
    4.
    发明申请
    METHODS OF FORMING A LAYER FOR BARRIER APPLICATIONS IN AN INTERCONNECT STRUCTURE 有权
    在互连结构中形成障碍物应用层的方法

    公开(公告)号:US20090227105A1

    公开(公告)日:2009-09-10

    申请号:US12041804

    申请日:2008-03-04

    IPC分类号: H01L21/44 H01L21/285

    摘要: Methods of forming a barrier layer are provided. In one embodiment, the method includes providing a substrate into a physical vapor deposition (PVD) chamber, supplying at least two reactive gases and an inert gas into the PVD processing chamber, sputtering a source material from a target disposed in the processing chamber in the presence of a plasma formed from the gas mixture, and forming a metal containing dielectric layer on the substrate from the source material. In another embodiment, the method includes providing a substrate into a PVD chamber, supplying a reactive gas the PVD chamber, sputtering a source material from a target disposed in the PVD chamber in the presence of a plasma formed from the reactive gas, forming a metal containing dielectric layer on the substrate from the source material, and post treating the metal containing layer in presence of species generated from a remote plasma chamber.

    摘要翻译: 提供形成阻挡层的方法。 在一个实施例中,该方法包括将衬底提供到物理气相沉积(PVD)腔室中,将至少两种反应性气体和惰性气体供应到PVD处理腔室中,将来自设置在处理室中的靶的源材料溅射在 存在由气体混合物形成的等离子体,并且从源材料在衬底上形成含金属的电介质层。 在另一个实施例中,该方法包括将衬底提供到PVD腔室中,在反应气体形成的等离子体存在下,将反应气体提供给PVD腔室,从设置在PVD腔室中的靶材溅射源材料,形成金属 在来自源材料的基板上含有介电层,并且在从远程等离子体室产生的物质存在下对金属含有层进行后处理。

    Method For Segregating The Alloying Elements And Reducing The Residue Resistivity Of Copper Alloy Layers
    5.
    发明申请
    Method For Segregating The Alloying Elements And Reducing The Residue Resistivity Of Copper Alloy Layers 有权
    分离合金元素并降低铜合金层残留电阻率的方法

    公开(公告)号:US20120121799A1

    公开(公告)日:2012-05-17

    申请号:US12945445

    申请日:2010-11-12

    申请人: Xinyu Fu Jick M. Yu

    发明人: Xinyu Fu Jick M. Yu

    IPC分类号: H05K3/22

    摘要: Methods for forming interconnect or interconnections on a substrate for use in a microelectric device are disclosed. In one or more embodiments, the method includes depositing an alloy layer comprising Cu and an alloying element, for, example, Mn, in a dielectric layer and segregating or diffusing the alloying element from the bulk Cu portion of the alloy layer. In one or more embodiments, the method includes annealing the alloy layer in an atomic hydrogen atmosphere. After annealing, the alloy layer exhibits a resistivity that is substantially equivalent to the resistivity of a pure Cu layer.

    摘要翻译: 公开了在用于微电子器件的衬底上形成互连或互连的方法。 在一个或多个实施例中,该方法包括在电介质层中沉积包含Cu和合金元素(例如Mn)的合金层,并将合金元素与合金层的本体Cu部分分离或扩散。 在一个或多个实施例中,该方法包括在原子氢气氛中退火合金层。 退火后,合金层的电阻率基本上等于纯Cu层的电阻率。

    Remote plasma pre-clean with low hydrogen pressure
    6.
    发明授权
    Remote plasma pre-clean with low hydrogen pressure 有权
    远程等离子体预清洁,氢气压力低

    公开(公告)号:US07704887B2

    公开(公告)日:2010-04-27

    申请号:US11334803

    申请日:2006-01-17

    IPC分类号: B08B3/00 H01L21/302

    摘要: A plasma cleaning method particularly useful for removing photoresist and oxide residue from a porous low-k dielectric with a high carbon content prior to sputter deposition. A remote plasma source produces a plasma primarily of hydrogen radicals. The hydrogen pressure may be kept relatively low, for example, at 30 milliTorr. Optionally, helium may be added to the processing gas with the hydrogen partial pressure held below 150 milliTorr. Superior results are obtained with 70% helium in 400 milliTorr of hydrogen and helium. Preferably, an ion filter, such as a magnetic filter, removes hydrogen and other ions from the output of the remote plasma source and a supply tube from the remote plasma source includes a removable dielectric liner in combination with dielectric showerhead and manifold liner.

    摘要翻译: 一种等离子体清洗方法,特别适用于在溅射沉积之前从具有高碳含量的多孔低k电介质中除去光致抗蚀剂和氧化物残留物。 远程等离子体源产生主要为氢自由基的等离子体。 氢气压力可以保持相对较低,例如在30毫乇。 任选地,氦气可以被加到处理气体中,氢分压保持在150毫乇以下。 在400毫乇的氢气和氦气中,70%的氦气可获得卓越的结果。 优选地,诸如磁性过滤器的离子过滤器从远程等离子体源的输出中除去氢和其它离子,并且来自远程等离子体源的供应管包括与介电喷头和歧管衬套组合的可移除绝缘衬垫。

    Apparatus and a method for cleaning a dielectric film
    7.
    发明授权
    Apparatus and a method for cleaning a dielectric film 有权
    用于清洁电介质膜的装置和方法

    公开(公告)号:US07658802B2

    公开(公告)日:2010-02-09

    申请号:US11284775

    申请日:2005-11-22

    IPC分类号: B08B6/00

    摘要: An apparatus and a method of cleaning a dielectric film are provided in the present invention. In one embodiment, an apparatus of cleaning a dielectric film the apparatus includes a chamber body adapted to support a substrate therein, a remote plasma source adapted to provide a plurality of reactive radicals to the chamber body, a passage coupling the remote plasma source to the chamber body, and at least one magnet disposed adjacent the passage. In another embodiment, a method of cleaning a dielectric film that includes providing a substrate having an at least partially exposed dielectric layer disposed in a process chamber, generating a plurality of reactive radicals in a remote plasma source, flowing the reactive radicals from the remote plasma source into the process chamber through a passage having at least one magnet disposed adjacent the passage, and magnetically filtering the reactive radicals passing through the passage.

    摘要翻译: 在本发明中提供了一种清洁电介质膜的装置和方法。 在一个实施例中,一种清洁电介质膜的装置包括适于在其中支撑衬底的室主体,适于向室主体提供多个反应性基团的远程等离子体源,将远程等离子体源耦合到 室主体,以及邻近通道设置的至少一个磁体。 在另一个实施例中,一种清洁电介质膜的方法,该方法包括提供具有设置在处理室中的至少部分暴露的电介质层的衬底,在远程等离子体源中产生多个反应性基团,使来自远端等离子体的反应性基团 通过具有邻近通道设置的至少一个磁体的通道进入处理室,并对穿过通道的反应性基团进行磁过滤。

    Apparatus and a method for cleaning a dielectric film
    8.
    发明申请
    Apparatus and a method for cleaning a dielectric film 有权
    用于清洁电介质膜的装置和方法

    公开(公告)号:US20070113868A1

    公开(公告)日:2007-05-24

    申请号:US11284775

    申请日:2005-11-22

    IPC分类号: B08B6/00

    摘要: An apparatus and a method of cleaning a dielectric film are provided in the present invention. In one embodiment, an apparatus of cleaning a dielectric film the apparatus includes a chamber body adapted to support a substrate therein, a remote plasma source adapted to provide a plurality of reactive radicals to the chamber body, a passage coupling the remote plasma source to the chamber body, and at least one magnet disposed adjacent the passage. In another embodiment, a method of cleaning a dielectric film that includes providing a substrate having an at least partially exposed dielectric layer disposed in a process chamber, generating a plurality of reactive radicals in a remote plasma source, flowing the reactive radicals from the remote plasma source into the process chamber through a passage having at least one magnet disposed adjacent the passage, and magnetically filtering the reactive radicals passing through the passage.

    摘要翻译: 在本发明中提供了一种清洁电介质膜的装置和方法。 在一个实施例中,一种清洁电介质膜的装置包括适于在其中支撑衬底的室主体,适于向室主体提供多个反应性基团的远程等离子体源,将远程等离子体源耦合到 室主体,以及邻近通道设置的至少一个磁体。 在另一个实施例中,一种清洁电介质膜的方法,该方法包括提供具有设置在处理室中的至少部分暴露的电介质层的衬底,在远程等离子体源中产生多个反应性基团,使来自远端等离子体的反应性基团 通过具有邻近通道设置的至少一个磁体的通道进入处理室,并对穿过通道的反应性基团进行磁过滤。

    Method for segregating the alloying elements and reducing the residue resistivity of copper alloy layers
    10.
    发明授权
    Method for segregating the alloying elements and reducing the residue resistivity of copper alloy layers 有权
    分离合金元素并降低铜合金层残留电阻率的方法

    公开(公告)号:US08852674B2

    公开(公告)日:2014-10-07

    申请号:US12945445

    申请日:2010-11-12

    申请人: Xinyu Fu Jick M. Yu

    发明人: Xinyu Fu Jick M. Yu

    摘要: Methods for forming interconnect or interconnections on a substrate for use in a microelectric device are disclosed. In one or more embodiments, the method includes depositing an alloy layer comprising Cu and an alloying element, for, example, Mn, in a dielectric layer and segregating or diffusing the alloying element from the bulk Cu portion of the alloy layer. In one or more embodiments, the method includes annealing the alloy layer in an atomic hydrogen atmosphere. After annealing, the alloy layer exhibits a resistivity that is substantially equivalent to the resistivity of a pure Cu layer.

    摘要翻译: 公开了在用于微电子器件的衬底上形成互连或互连的方法。 在一个或多个实施例中,该方法包括在电介质层中沉积包含Cu和合金元素(例如Mn)的合金层,并将合金元素与合金层的本体Cu部分分离或扩散。 在一个或多个实施例中,该方法包括在原子氢气氛中退火合金层。 退火后,合金层的电阻率基本上等于纯Cu层的电阻率。