Automated semiconductor probing device
    1.
    发明授权
    Automated semiconductor probing device 失效
    自动半导体探测装置

    公开(公告)号:US06825680B1

    公开(公告)日:2004-11-30

    申请号:US09885362

    申请日:2001-06-20

    IPC分类号: G01R3102

    CPC分类号: G01R31/2887

    摘要: Apparatus and methods are provided for automated semiconductor device probing. The apparatus includes a probe assembly; a machine vision system; and a semiconductor support fixture. A method includes providing apparatus for automated semiconductor device probing; locating the semiconductor device positioned on the semiconductor support fixture with the machine vision system; guiding the movement of at least one of the probe assembly and the semiconductor support fixture so as to position a contact portion of the semiconductor device and the electrical probe in alignment with one another; and moving at least one of the probe assembly and the semiconductor support fixture toward the other of the at least one of the probe assembly and the semiconductor support fixture so as to position the electrical probe and the contact portion of the semiconductor device in electrical connection with one another.

    摘要翻译: 提供了用于自动半导体器件探测的装置和方法。 该装置包括探针组件; 机器视觉系统; 和半导体支架。 一种方法包括提供用于自动半导体器件探测的装置; 利用机器视觉系统定位位于半导体支架上的半导体器件; 引导所述探针组件和所述半导体支撑固定装置中的至少一个的移动,以使所述半导体器件和所述电探针的接触部分彼此对齐; 以及将所述探针组件和所述半导体支撑固定件中的至少一个移动到所述探针组件和所述半导体支撑固定装置中的所述至少一个探针组件和所述半导体支撑固定装置中的另一个,以便将所述电探针和所述半导体器件的接触部分 另一个。

    Method and apparatus for calibrating a fabry-perot interferometer based measurement system
    2.
    发明授权
    Method and apparatus for calibrating a fabry-perot interferometer based measurement system 失效
    用于校准基于法布里罗干涉仪的测量系统的方法和装置

    公开(公告)号:US06744524B1

    公开(公告)日:2004-06-01

    申请号:US10103416

    申请日:2002-06-03

    IPC分类号: G01B902

    CPC分类号: G01J3/26

    摘要: A method and apparatus is provided for calibrating a Fabry-Perot etalon based optical measurement system. The calibration is performed by analyzing the shape of transmission peaks output from the etalon in response to a known optical signal and using that information, along with a formula that approximates the response of the etalon, to perform the calibration.

    摘要翻译: 提供了一种用于校准基于法布里 - 珀罗标准具的光学测量系统的方法和装置。 通过响应于已知的光信号分析从标准具输出的透射峰的形状并使用该信息以及近似于标准具的响应的公式来执行校准来执行校准。

    Wide dynamic range optical power detector
    3.
    发明授权
    Wide dynamic range optical power detector 有权
    宽动态范围光功率检测器

    公开(公告)号:US06677570B1

    公开(公告)日:2004-01-13

    申请号:US09847506

    申请日:2001-05-02

    IPC分类号: H01J4014

    摘要: According to an aspect of the present invention, a power detector including a photodiode and a logarithmic transimpedance amplifier is mounted inside a hermetically sealed package in such a way that the photodiode and the logarithmic transimpedance amplifier are located on the same thermally conductive substrate.

    摘要翻译: 根据本发明的一个方面,包括光电二极管和对数跨阻抗放大器的功率检测器安装在密封封装内,使得光电二极管和对数跨阻抗放大器位于相同的导热基板上。

    Method and apparatus for wavelength and power measurement for tunable laser control
    5.
    发明授权
    Method and apparatus for wavelength and power measurement for tunable laser control 失效
    用于可调谐激光控制的波长和功率测量的方法和装置

    公开(公告)号:US06765682B1

    公开(公告)日:2004-07-20

    申请号:US10044250

    申请日:2002-01-11

    IPC分类号: G01B902

    摘要: According to an aspect of the present invention, a circuit is provided for determining the wavelength and power of a given optical signal across a wide dynamic range. The wavelength and power determinations are performed by logarithmic ratio amplifier in concert with a digital signal processor that utilizes representative equations of the measured optical signal.

    摘要翻译: 根据本发明的一个方面,提供一种用于确定在宽动态范围内的给定光信号的波长和功率的电路。 波形和功率确定由对数比放大器与利用所测量的光信号的代表性方程的数字信号处理器一起执行。

    Micro-electro-mechanical pressure sensor
    7.
    发明申请
    Micro-electro-mechanical pressure sensor 审中-公开
    微机电压力传感器

    公开(公告)号:US20070074574A1

    公开(公告)日:2007-04-05

    申请号:US11438898

    申请日:2006-05-23

    IPC分类号: G01L11/00

    CPC分类号: G01L21/22

    摘要: A pressure sensor is disclosed for measuring fluid pressure comprising a pressure sensing structure comprising a mass target suspended on a spring mechanism, wherein the mass target and the spring mechanism together exhibit high Q mechanical resonance, wherein the mass target has an area which is presented in a plane perpendicular to the direction of the mechanical oscillation of the structure, and further wherein the mass target and the spring mechanism are in the form of a membrane, and transducer means for measuring the fluid pressure by characterizing the effects that the fluid molecules produce on the motion of the structure.

    摘要翻译: 公开了一种用于测量流体压力的压力传感器,包括包括悬挂在弹簧机构上的质量目标的压力感测结构,其中质量目标和弹簧机构一起显示高Q机械共振,其中质量目标具有呈现在 垂直于结构的机械振荡方向的平面,其中质量目标和弹簧机构为膜的形式,以及用于通过表征流体分子产生的影响来测量流体压力的换能器装置 结构的运动。

    Method and apparatus for precision three-dimensional opto-mechanical assembly
    8.
    发明授权
    Method and apparatus for precision three-dimensional opto-mechanical assembly 有权
    精密三维光机械装配方法与装置

    公开(公告)号:US06441895B1

    公开(公告)日:2002-08-27

    申请号:US09789020

    申请日:2001-02-20

    IPC分类号: G01B900

    CPC分类号: G02B6/4225 G02B6/4227

    摘要: A method for achieving three-dimensional alignment of a pair of optical components, and apparatus for supporting such method, is initiated by fixing one of the optical components at a selected location on a semiconductor substrate. Subsequently, the other optical component and its associated submount are attached to a pair of coupled motion stages. A reference signal, to which the first optical component has been aligned, is transmitted to the other component and to a detector. That detector is positioned to measure changes in a selected characteristic of the reference signal, such as changes in optical power, as the position of the second optical component and its submount are manipulated. Through the use of a feedback loop, the second component and submount are moved in a pattern until an optimal alignment is converged upon.

    摘要翻译: 一种用于实现一对光学部件的三维对准的方法以及用于支持这种方法的装置是通过将一个光学部件固定在半导体衬底上的选定位置来启动的。 随后,另一个光学部件及其相关联的基座被附接到一对耦合的运动级。 已经对准第一光学部件的参考信号被传输到另一部件和检测器。 该检测器定位成测量参考信号的选定特性的变化,例如光功率的变化,因为第二光学部件及其副安装座的位置被操纵。 通过使用反馈回路,第二组件和底座以模式移动,直到最佳对准收敛为止。

    Micro-electro-mechanical pressure sensor
    9.
    发明授权
    Micro-electro-mechanical pressure sensor 有权
    微机电压力传感器

    公开(公告)号:US07047810B2

    公开(公告)日:2006-05-23

    申请号:US10758354

    申请日:2004-01-15

    IPC分类号: G01L11/00

    CPC分类号: G01L21/22

    摘要: A pressure sensor is disclosed for measuring fluid pressure comprising a pressure sensing structure comprising a mass target suspended on a spring mechanism, wherein the mass target and the spring mechanism together exhibit high Q mechanical resonance, wherein the mass target has an area which is presented in a plane perpendicular to the direction of the mechanical oscillation of the structure, and further wherein the mass target and the spring mechanism are in the form of a membrane, and transducer means for measuring the fluid pressure by characterizing the effects that the fluid molecules produce on the motion of the structure.

    摘要翻译: 公开了一种用于测量流体压力的压力传感器,包括包括悬挂在弹簧机构上的质量目标的压力感测结构,其中质量目标和弹簧机构一起显示高Q机械共振,其中质量目标具有呈现在 垂直于结构的机械振荡方向的平面,其中质量目标和弹簧机构为膜的形式,以及用于通过表征流体分子产生的影响来测量流体压力的换能器装置 结构的运动。

    Electronic method and apparatus for measuring optical wavelength and locking to a set optical wavelength of Fabry-Perot tunable cavity opto-electronic devices
    10.
    发明授权
    Electronic method and apparatus for measuring optical wavelength and locking to a set optical wavelength of Fabry-Perot tunable cavity opto-electronic devices 失效
    用于测量光学波长并锁定到法布里 - 珀罗可调谐腔光电器件的设定光学波长的电子方法和装置

    公开(公告)号:US06831450B2

    公开(公告)日:2004-12-14

    申请号:US10264060

    申请日:2002-10-03

    申请人: Yakov Kogan

    发明人: Yakov Kogan

    IPC分类号: G01N2700

    摘要: Apparatus and methods are provided for measuring a selected optical behavior of a tunable opto-electric device by using the electrical characteristics of the opto-electronic device. The benefit of the present invention is the elimination or reduction in complexity of optical wavelength reference hardware that is currently required for wavelength referencing and locking. Accordingly, the present invention reduces the cost and complexity of the optical packaging of tunable opto-electronic telecommunication components. Furthermore, the present invention also significantly simplifies optical and electronic design of system level products with tunable opto-electronic devices.

    摘要翻译: 提供了通过使用光电器件的电特性来测量可调谐光电器件的选定光学特性的装置和方法。 本发明的优点是消除或降低了当前波长参考和锁定所需的光学波长参考硬件的复杂性。 因此,本发明降低了可调谐光电通信部件的光学封装的成本和复杂性。 此外,本发明还显着简化了具有可调谐光电器件的系统级产品的光学和电子设计。