摘要:
A framework of wireless network access device, comprising a communication circuit board with a first electrical connecting portion, a wireless transmission circuit board with a second electrical connecting portion, and at least a signal transmission element connecting with the first and second connecting portions respectively, wherein the signal transmission element is provided for transmitting a signal between the communication circuit board and the wireless transmission circuit board, so as to solve drawbacks of the prior art.
摘要:
A control device having an output pin expansion function and an output pin expansion method thereof are provided. The method includes: connecting at least a shift register unit having a plurality of data transmission pins to a control unit such that the shift register unit can receive strobe signals, a multi-bit data stream, clock signals and enable signals generated by the control unit; sending an enable signal by the control unit so as to allow the shift register unit to shift and store each bit of a multi-bit data stream according to a clock signal generated by the control unit; and sending a strobe signal by the control unit so as to allow the shift register unit to output the multi-bit data in parallel format as opposed to the received serial format through the plurality of data transmission pins, thereby allowing a processing device to interface with more devices (such as LED state indicators) than its fixed number of dedicated output pins would conveniently allow, thus saving costs and board space.
摘要:
A framework of wireless network access device, comprising a communication circuit board with a first electrical connecting portion, a wireless transmission circuit board with a second electrical connecting portion, and at least a signal transmission element connecting with the first and second connecting portions respectively, wherein the signal transmission element is provided for transmitting a signal between the communication circuit board and the wireless transmission circuit board, so as to solve drawbacks of the prior art.
摘要:
A control device having an output pin expansion function and an output pin expansion method thereof are provided. The method includes: connecting at least a shift register unit having a plurality of data transmission pins to a control unit such that the shift register unit can receive strobe signals, a multi-bit data stream, clock signals and enable signals generated by the control unit; sending an enable signal by the control unit so as to allow the shift register unit to shift and store each bit of a multi-bit data stream according to a clock signal generated by the control unit; and sending a strobe signal by the control unit so as to allow the shift register unit to output the multi-bit data in parallel format as opposed to the received serial format through the plurality of data transmission pins, thereby allowing a processing device to interface with more devices (such as LED state indicators) than its fixed number of dedicated output pins would conveniently allow, thus saving costs and board space.
摘要:
The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.
摘要:
The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.
摘要:
A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.
摘要:
The present invention relates to a test system, and in particular relates to a test system capable of testing a plurality of chips simultaneously. The test system comprises a single-chip tester and a handler. The single-chip tester further comprises a pattern memory and a micro-processor. The pattern memory comprises a plurality of pattern units for respectively performing a function pattern test on the plurality of chips and generating a test result mapping to the plurality of chips. The micro-processor performs various tests and generating an interface control signal according to the test result. The handler initiates the micro-processor for performing various tests and receives the interface control signal to finish testing the plurality of chips. The pluralities of chips are set to the handler.
摘要:
The present invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a signal transformation module, a meter, and a logic tester. The signal transformation module is coupled to the device under test and transforms an analog output signal generated by the device under test into a DC signal. The meter is coupled to the signal transformation module and measures the DC signal so as to generate a digital measuring result. The logic tester is coupled to the meter and determines a test result for the device under test according to the digital measuring result.